XLPE cable insulation resistance modelling under annealing and thermal ageing effects

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Abstract

Cross-linked polyethylene (XLPE) insulated electrical cables are widely deployed for electricity transmission due to the reliable thermomechanical performance and excellent electrical dielectric properties of XLPE insulation. Insulation resistance (IR) is a common metric indicating the electrical condition of cable insulation that undergoes annealing and thermal ageing over its service life. Most research related to the IR simulation deals with either the thermal ageing process of XLPE insulation itself or the annealing process of XLPE insulation by considering the diffusion of chemical specifies from semicon layers. This paper develops a discretisation IR model to estimate the temperature distribution across the XLPE insulation layer and simulate the IR drop under the thermal ageing effect or the U-shape variation of IR under the joint effects of annealing and thermal ageing, respectively. The IR simulation results are discussed around the necessity of combining annealing and thermal ageing effects for IR simulation with the presence of semicon layers.
Original languageEnglish
Pages1-4
Number of pages4
Publication statusPublished - 19 Oct 2023
Event98th IEEE Conference on Electrical Insulation and Dielectric Phenomena - 2 Meadowlands Plaza, East Rutherford, United States
Duration: 15 Oct 202319 Oct 2023
https://ceidp.org/

Conference

Conference98th IEEE Conference on Electrical Insulation and Dielectric Phenomena
Abbreviated titleIEEE CEIDP 2023
Country/TerritoryUnited States
CityEast Rutherford
Period15/10/2319/10/23
Internet address

Keywords

  • cross-linked polyethylene cable
  • insulation resistance
  • annealing
  • thermal ageing
  • discretisation model

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