Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results

Mohamed Elawady; Christophe Ducottet; Olivier Alata; Cécile Barat; Philippe Colantoni

doi:10.1109/ICCVW.2017.203

Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results

Mohamed Elawady, Christophe Ducottet, Olivier Alata, Cécile Barat, Philippe Colantoni

Computer And Information Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

5 Citations (Scopus)

Abstract

The proposed algorithm detects globally the symmetry axes inside an image plane. The main steps are as follows: We firstly extract edge features using Log-Gabor filters with different scales and orientations. Afterwards, we use the edge characteristics associated with the textural and color information as symmetrical weights for voting triangulation. In the end, we construct a polar-based voting histogram based on the accumulation of the symmetry contribution (local texture and color information), in order to find the maximum peaks presenting as candidates of the primary symmetry axes.

Original language	English
Title of host publication	Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017
Pages	1734-1738
Number of pages	5
ISBN (Electronic)	9781538610343
DOIs	https://doi.org/10.1109/ICCVW.2017.203
Publication status	Published - 29 Oct 2017
Event	16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017 - Venice, Italy Duration: 22 Oct 2017 → 29 Oct 2017

Publication series

Name	Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017
Volume	2018-January

Conference

Conference	16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017
Country/Territory	Italy
City	Venice
Period	22/10/17 → 29/10/17

Keywords

algorithm
image color analysis
histograms
image edge detection
grey-scale
feature extraction

Access to Document

10.1109/ICCVW.2017.203

Cite this

Elawady, M., Ducottet, C., Alata, O., Barat, C., & Colantoni, P. (2017). Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results. In Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017 (pp. 1734-1738). (Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017; Vol. 2018-January). https://doi.org/10.1109/ICCVW.2017.203

Elawady, Mohamed ; Ducottet, Christophe ; Alata, Olivier et al. / Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms : Algorithm and Results. Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017. 2017. pp. 1734-1738 (Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017).

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title = "Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results",

abstract = "The proposed algorithm detects globally the symmetry axes inside an image plane. The main steps are as follows: We firstly extract edge features using Log-Gabor filters with different scales and orientations. Afterwards, we use the edge characteristics associated with the textural and color information as symmetrical weights for voting triangulation. In the end, we construct a polar-based voting histogram based on the accumulation of the symmetry contribution (local texture and color information), in order to find the maximum peaks presenting as candidates of the primary symmetry axes.",

keywords = "algorithm, image color analysis, histograms, image edge detection, grey-scale, feature extraction",

author = "Mohamed Elawady and Christophe Ducottet and Olivier Alata and C{\'e}cile Barat and Philippe Colantoni",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017 ; Conference date: 22-10-2017 Through 29-10-2017",

year = "2017",

month = oct,

day = "29",

doi = "10.1109/ICCVW.2017.203",

language = "English",

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Elawady, M, Ducottet, C, Alata, O, Barat, C & Colantoni, P 2017, Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results. in Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017. Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017, vol. 2018-January, pp. 1734-1738, 16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017, Venice, Italy, 22/10/17. https://doi.org/10.1109/ICCVW.2017.203

Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results. / Elawady, Mohamed; Ducottet, Christophe; Alata, Olivier et al.
Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017. 2017. p. 1734-1738 (Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017; Vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

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AB - The proposed algorithm detects globally the symmetry axes inside an image plane. The main steps are as follows: We firstly extract edge features using Log-Gabor filters with different scales and orientations. Afterwards, we use the edge characteristics associated with the textural and color information as symmetrical weights for voting triangulation. In the end, we construct a polar-based voting histogram based on the accumulation of the symmetry contribution (local texture and color information), in order to find the maximum peaks presenting as candidates of the primary symmetry axes.

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KW - image color analysis

KW - histograms

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KW - grey-scale

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Elawady M, Ducottet C, Alata O, Barat C, Colantoni P. Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results. In Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017. 2017. p. 1734-1738. (Proceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017). doi: 10.1109/ICCVW.2017.203

Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results

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