Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects

Yashar Javadi, Charles N. MacLeod, Stephen G. Pierce, Anthony Gachagan, David Lines, Carmelo Mineo, Jialuo Ding, Stewart Williams, Momchil Vasilev, Ehsan Mohseni, Riliang Su

Research output: Contribution to journalArticlepeer-review

29 Citations (Scopus)
55 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds