Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects

Yashar Javadi, Charles N. MacLeod, Stephen G. Pierce, Anthony Gachagan, David Lines, Carmelo Mineo, Jialuo Ding, Stewart Williams, Momchil Vasilev, Ehsan Mohseni, Riliang Su

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26 Citations (Scopus)
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