Transverse patterns and length-scale selection in vertical-cavity surface-emitting lasers with a large square aperture

M.  Schulz-Ruhtenberg; I. V.  Babushkin; N. A.  Loiko; T.  Ackemann; K. F.  Huang

doi:10.1007/s00340-005-2012-1

Transverse patterns and length-scale selection in vertical-cavity surface-emitting lasers with a large square aperture

M. Schulz-Ruhtenberg, I. V. Babushkin, N. A. Loiko, T. Ackemann, K. F. Huang

Research output: Contribution to journal › Article

23 Citations (Scopus)

Abstract

The length-scale selection in complex emission patterns spontaneously arising in broad-area vertical-cavity surface-emitting lasers is studied experimentally. The wavenumbers of individual tilted wave modes show a square-root-like dependence on the detuning between emission frequency and longitudinal cavity resonance, in accordance with theoretical expectations. The absolute values of the wavenumbers are in good qualitative agreement with calculations taking into account the reflection properties of the Bragg reflectors and dispersion.

Original language	English
Pages (from-to)	945-953
Number of pages	9
Journal	Applied Physics B: Lasers and Optics
Volume	81
Issue number	7
DOIs	https://doi.org/10.1007/s00340-005-2012-1
Publication status	Published - 5 Nov 2005

Keywords

semiconductors
lasers
reflection
vcsel
mirrors

Access to Document

10.1007/s00340-005-2012-1

http://link.springer.com/journal/340

Cite this

Schulz-Ruhtenberg, M., Babushkin, I. V., Loiko, N. A., Ackemann, T., & Huang, K. F. (2005). Transverse patterns and length-scale selection in vertical-cavity surface-emitting lasers with a large square aperture. Applied Physics B: Lasers and Optics, 81(7), 945-953. https://doi.org/10.1007/s00340-005-2012-1

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AU - Ackemann, T.

AU - Huang, K. F.

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AB - The length-scale selection in complex emission patterns spontaneously arising in broad-area vertical-cavity surface-emitting lasers is studied experimentally. The wavenumbers of individual tilted wave modes show a square-root-like dependence on the detuning between emission frequency and longitudinal cavity resonance, in accordance with theoretical expectations. The absolute values of the wavenumbers are in good qualitative agreement with calculations taking into account the reflection properties of the Bragg reflectors and dispersion.

KW - semiconductors

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KW - reflection

KW - vcsel

KW - mirrors

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DO - 10.1007/s00340-005-2012-1

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