Abstract
We present a novel heterodyne-detected four-wave mixing technique, which determines the third-order nonlinear polarization in phase and amplitude by spectral interferometry. It allows us to measure the resonant transient four-wave mixing of single localized excitons, both frequency and time-resolved. In the signal, the strength of the coupling between two probed exciton transitions is directly observable. Applying a strong optical pump pulse, we observe optical Rabi oscillations of the exciton polarization. Observing decay of the third-order polarization after the pump pulse, we can exclude the presence of signi£cant excitation-induced dephasing.
Original language | English |
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Title of host publication | Physics of Semiconductors |
Subtitle of host publication | 27th International Conference on the Physics of Semiconductors, ICPS-27 |
Pages | 1232-1233 |
Number of pages | 2 |
Volume | 772 |
DOIs | |
Publication status | Published - 30 Jun 2005 |
Event | PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States Duration: 26 Jul 2004 → 30 Jul 2004 |
Conference
Conference | PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 |
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Country/Territory | United States |
City | Flagstaff, AZ |
Period | 26/07/04 → 30/07/04 |
Keywords
- nanomaterials
- interferometry
- four wave mixing
- quantum information
- excitons
- quantum optics