Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach.

Dimitrios Lamprou, James R. Smith, Thomas G. Nevell, Eugen Barbu, Colin R. Willis, John Tsibouklis

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl)triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl)propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.
LanguageEnglish
Pages137-142
Number of pages6
JournalJournal of Advanced Microscopy Research
Volume5
Issue number2
DOIs
Publication statusPublished - Aug 2010

Fingerprint

Interfacial energy
surface energy
atomic force microscopy
Atomic force microscopy
Silanes
Methacrylates
Anhydrides
anhydrides
Angle measurement
silanes
Contact angle
Polymers
Atoms
high resolution
polymers
Liquids
liquids
atoms

Keywords

  • nanometer scale
  • surface energy
  • goniometry
  • organosilanes
  • atomic force microscopy

Cite this

Lamprou, Dimitrios ; Smith, James R. ; Nevell, Thomas G. ; Barbu, Eugen ; Willis, Colin R. ; Tsibouklis, John. / Towards the determination of surface energy at the nanoscale : a further assessment of the AFM-based approach. In: Journal of Advanced Microscopy Research. 2010 ; Vol. 5, No. 2. pp. 137-142.
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Towards the determination of surface energy at the nanoscale : a further assessment of the AFM-based approach. / Lamprou, Dimitrios; Smith, James R.; Nevell, Thomas G.; Barbu, Eugen; Willis, Colin R.; Tsibouklis, John.

In: Journal of Advanced Microscopy Research, Vol. 5, No. 2, 08.2010, p. 137-142.

Research output: Contribution to journalArticle

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AB - Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl)triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl)propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.

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