Abstract
Language | English |
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Article number | 024101 |
Number of pages | 17 |
Journal | Review of Scientific Instruments |
Volume | 87 |
Early online date | 19 Feb 2016 |
DOIs | |
Publication status | E-pub ahead of print - 19 Feb 2016 |
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Keywords
- microfluidic devices
- synchrotron
- infrared
- spectroscopic measurement
- catalytic process
- interference fringes
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Towards microfluidic reactors for in situ synchrotron infrared studies. / Silverwood, I. P.; Al-Rifai, N.; Cao, E.; Nelson, D. J.; Chutia, A.; Wells, P. P.; Nolan, S. P.; Frogley, M. D.; Cinque, G.; Gavriilidis, A.; Catlow, C. R. A.
In: Review of Scientific Instruments, Vol. 87, 024101, 19.02.2016.Research output: Contribution to journal › Article
TY - JOUR
T1 - Towards microfluidic reactors for in situ synchrotron infrared studies
AU - Silverwood, I. P.
AU - Al-Rifai, N.
AU - Cao, E.
AU - Nelson, D. J.
AU - Chutia, A.
AU - Wells, P. P.
AU - Nolan, S. P.
AU - Frogley, M. D.
AU - Cinque, G.
AU - Gavriilidis, A.
AU - Catlow, C. R. A.
N1 - The following article has been submitted to/accepted by Review of Scientific Instruments. After it is published, it will be found at (http://scitation.aip.org/content/aip/journal/rsi).
PY - 2016/2/19
Y1 - 2016/2/19
N2 - Anodically bonded etched silicon microfluidic devices that allow infrared spectroscopic measurement of solutions are reported. These extend spatially well-resolved in situ infrared measurement to higher temperatures and pressures than previously reported, making them useful for effectively time-resolved measurement of realistic catalytic processes. A data processing technique necessary for the mitigation of interference fringes caused by multiple reflections of the probe beam is also described
AB - Anodically bonded etched silicon microfluidic devices that allow infrared spectroscopic measurement of solutions are reported. These extend spatially well-resolved in situ infrared measurement to higher temperatures and pressures than previously reported, making them useful for effectively time-resolved measurement of realistic catalytic processes. A data processing technique necessary for the mitigation of interference fringes caused by multiple reflections of the probe beam is also described
KW - microfluidic devices
KW - synchrotron
KW - infrared
KW - spectroscopic measurement
KW - catalytic process
KW - interference fringes
UR - http://scitation.aip.org/content/aip/journal/rsi
U2 - 10.1063/1.4941825
DO - 10.1063/1.4941825
M3 - Article
VL - 87
JO - Review of Scientific Instruments
T2 - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
M1 - 024101
ER -