ToF-SIMS: methods & applications

Aruna Prakash; Michael Chrubasik; Thomas McGlone; Blair Johnston

ToF-SIMS: methods & applications

Aruna Prakash, Michael Chrubasik, Thomas McGlone, Blair Johnston

Research output: Contribution to conference › Poster

27 Downloads (Pure)

Abstract

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.

Original language	English
Pages	46
Number of pages	1
Publication status	Published - 16 May 2022
Event	CMAC Annual Open Day 2022 - Glasgow, United Kingdom Duration: 16 May 2022 → 18 May 2022

Conference

Conference	CMAC Annual Open Day 2022
Country/Territory	United Kingdom
City	Glasgow
Period	16/05/22 → 18/05/22

Keywords

Time-of-Flight Secondary Ion Mass Spectrometry
molecular variation
sub-surface layers

Access to Document

Prakash-etal-CMAC-2022-ToF-SIMS-methods-and-applicationsFinal published version, 862 KBLicence: Strath_1

Cite this

@conference{061f4a6531344052b4b1a740dc400a6e,

title = "ToF-SIMS: methods & applications",

abstract = "Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.",

keywords = "Time-of-Flight Secondary Ion Mass Spectrometry, molecular variation, sub-surface layers",

author = "Aruna Prakash and Michael Chrubasik and Thomas McGlone and Blair Johnston",

year = "2022",

month = may,

day = "16",

language = "English",

pages = "46",

note = "CMAC Annual Open Day 2022 ; Conference date: 16-05-2022 Through 18-05-2022",

}

TY - CONF

T1 - ToF-SIMS

T2 - CMAC Annual Open Day 2022

AU - Prakash, Aruna

AU - Chrubasik, Michael

AU - McGlone, Thomas

AU - Johnston, Blair

PY - 2022/5/16

Y1 - 2022/5/16

N2 - Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.

AB - Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.

KW - Time-of-Flight Secondary Ion Mass Spectrometry

KW - molecular variation

KW - sub-surface layers

M3 - Poster

SP - 46

Y2 - 16 May 2022 through 18 May 2022

ER -

ToF-SIMS: methods & applications

Abstract

Conference

Keywords

Access to Document

Fingerprint

Cite this