ToF-SIMS imaging of amorphous solid dispersions: a stability study

Eleonora Paladino, Frederik Doerr, Iyke I. Onyemelukwe, Ian Gilmore, Gavin Halbert

Research output: Contribution to conference › Speech

Original language	English
Publication status	Unpublished - 20 Oct 2019
Event	22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) - Kyoto, Japan Duration: 20 Oct 2019 → 25 Oct 2019 http://siss-sims.com/sims22/

Conference	22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)
Country	Japan
City	Kyoto
Period	20/10/19 → 25/10/19
Internet address	http://siss-sims.com/sims22/

Keywords

@conference{1018d77e403d466d97031813e25baa14,

title = "ToF-SIMS imaging of amorphous solid dispersions: a stability study",

keywords = "secondary ion mass spectrometry, mass spectrometry imaging, ToF-SIMS, hot melt extrusion, chemical imaging",

author = "Eleonora Paladino and Frederik Doerr and Onyemelukwe, {Iyke I.} and Ian Gilmore and Gavin Halbert",

year = "2019",

month = oct,

day = "20",

language = "English",

note = "22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) ; Conference date: 20-10-2019 Through 25-10-2019",

url = "http://siss-sims.com/sims22/",

}

TY - CONF

T1 - ToF-SIMS imaging of amorphous solid dispersions

T2 - 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)

AU - Paladino, Eleonora

AU - Doerr, Frederik

AU - Onyemelukwe, Iyke I.

AU - Gilmore, Ian

AU - Halbert, Gavin

PY - 2019/10/20

Y1 - 2019/10/20

KW - secondary ion mass spectrometry

KW - mass spectrometry imaging

KW - ToF-SIMS

KW - hot melt extrusion

KW - chemical imaging

M3 - Speech

Y2 - 20 October 2019 through 25 October 2019

ER -