ToF-SIMS imaging of amorphous solid dispersions: a stability study

Eleonora Paladino, Frederik Doerr, Iyke I. Onyemelukwe, Ian Gilmore, Gavin Halbert

Research output: Contribution to conferenceSpeech

Original languageEnglish
Publication statusUnpublished - 20 Oct 2019
Event22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) - Kyoto, Japan
Duration: 20 Oct 201925 Oct 2019
http://siss-sims.com/sims22/

Conference

Conference22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)
CountryJapan
CityKyoto
Period20/10/1925/10/19
Internet address

Keywords

  • secondary ion mass spectrometry
  • mass spectrometry imaging
  • ToF-SIMS
  • hot melt extrusion
  • chemical imaging

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