ToF-SIMS imaging of amorphous solid dispersions: a stability study

Original language	English
Publication status	Unpublished - 20 Oct 2019
Event	22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) - Kyoto, Japan Duration: 20 Oct 2019 → 25 Oct 2019 http://siss-sims.com/sims22/

Conference

Conference	22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)
Country/Territory	Japan
City	Kyoto
Period	20/10/19 → 25/10/19
Internet address	http://siss-sims.com/sims22/

Keywords

• secondary ion mass spectrometry
• mass spectrometry imaging
• ToF-SIMS
• hot melt extrusion
• chemical imaging

Datasets

• Data for: "Applications of ToF-SIMS imaging in pharmaceutical manufacturing: quantitative characterisation through image analysis strategies and multimodal imaging approaches"

  Paladino, E. (Creator) & Halbert, G. (Creator), University of Strathclyde, 19 Apr 2021

  DOI: 10.15129/f9129326-dbb8-49b3-9a2d-c45da73f292a

  Dataset

Prizes

• Rowland Hill Prize for the Best Presentation at the 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS 22)

  Paladino, E. (Recipient), 24 Oct 2019

  Prize: Prize (including medals and awards)

Cite this

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Paladino, E., Doerr, F., Onyemelukwe, I. I., Gilmore, I., & Halbert, G. (2019). ToF-SIMS imaging of amorphous solid dispersions: a stability study. 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22), Kyoto, Japan.

Paladino, Eleonora ; Doerr, Frederik ; Onyemelukwe, Iyke I. ; Gilmore, Ian ; Halbert, Gavin. / ToF-SIMS imaging of amorphous solid dispersions : a stability study. 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22), Kyoto, Japan.

@conference{1018d77e403d466d97031813e25baa14,

title = "ToF-SIMS imaging of amorphous solid dispersions: a stability study",

keywords = "secondary ion mass spectrometry, mass spectrometry imaging, ToF-SIMS, hot melt extrusion, chemical imaging",

author = "Eleonora Paladino and Frederik Doerr and Onyemelukwe, {Iyke I.} and Ian Gilmore and Gavin Halbert",

year = "2019",

month = oct,

day = "20",

language = "English",

note = "22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) ; Conference date: 20-10-2019 Through 25-10-2019",

url = "http://siss-sims.com/sims22/",

}

Paladino, E, Doerr, F, Onyemelukwe, II, Gilmore, I & Halbert, G 2019, 'ToF-SIMS imaging of amorphous solid dispersions: a stability study', 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22), Kyoto, Japan, 20/10/19 - 25/10/19.

ToF-SIMS imaging of amorphous solid dispersions : a stability study. / Paladino, Eleonora; Doerr, Frederik; Onyemelukwe, Iyke I.; Gilmore, Ian; Halbert, Gavin.

2019. 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22), Kyoto, Japan.

Research output: Contribution to conference › Speech

TY - CONF

T1 - ToF-SIMS imaging of amorphous solid dispersions

T2 - 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)

AU - Paladino, Eleonora

AU - Doerr, Frederik

AU - Onyemelukwe, Iyke I.

AU - Gilmore, Ian

AU - Halbert, Gavin

PY - 2019/10/20

Y1 - 2019/10/20

KW - secondary ion mass spectrometry

KW - mass spectrometry imaging

KW - ToF-SIMS

KW - hot melt extrusion

KW - chemical imaging

M3 - Speech

Y2 - 20 October 2019 through 25 October 2019

ER -

Paladino E, Doerr F, Onyemelukwe II, Gilmore I, Halbert G. ToF-SIMS imaging of amorphous solid dispersions: a stability study. 2019. 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22), Kyoto, Japan.