Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

Eleonora Paladino; David G. Watson; Melissa K. Passarelli; Dimitrios A. Lamprou

Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

Eleonora Paladino, David G. Watson, Melissa K. Passarelli, Dimitrios A. Lamprou

Research output: Contribution to conference › Poster

Abstract

Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

Original language	English
Number of pages	1
Publication status	Unpublished - Apr 2016
Event	2016 UKICRS Workshop & Symposium - Cardiff School of Pharmacy and Pharmaceutical Sciences, Cardiff, United Kingdom Duration: 21 Apr 2016 → 22 Apr 2016 http://www.ukicrs.org/2016-symposium.html

Conference

Conference	2016 UKICRS Workshop & Symposium
Country/Territory	United Kingdom
City	Cardiff
Period	21/04/16 → 22/04/16
Internet address	http://www.ukicrs.org/2016-symposium.html

Keywords

structure-property relationships
pharmaceutical manufacturing
tof-sims
spectrometry
pharmaceutical products

Cite this

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title = "Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences",

abstract = "Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.",

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year = "2016",

month = apr,

language = "English",

note = "2016 UKICRS Workshop \& Symposium ; Conference date: 21-04-2016 Through 22-04-2016",

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TY - CONF

T1 - Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

AU - Paladino, Eleonora

AU - Watson, David G.

AU - Passarelli, Melissa K.

AU - Lamprou, Dimitrios A.

PY - 2016/4

Y1 - 2016/4

N2 - Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

AB - Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

KW - structure-property relationships

KW - pharmaceutical manufacturing

KW - tof-sims

KW - spectrometry

KW - pharmaceutical products

M3 - Poster

T2 - 2016 UKICRS Workshop & Symposium

Y2 - 21 April 2016 through 22 April 2016

ER -

Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

Abstract

Conference

Keywords

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Cite this