Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

Eleonora Paladino, David G. Watson, Melissa K. Passarelli, Dimitrios A. Lamprou

Research output: Contribution to conferencePoster

Abstract

Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.
Original languageEnglish
Number of pages1
Publication statusUnpublished - Apr 2016
Event2016 UKICRS Workshop & Symposium - Cardiff School of Pharmacy and Pharmaceutical Sciences, Cardiff, United Kingdom
Duration: 21 Apr 201622 Apr 2016
http://www.ukicrs.org/2016-symposium.html

Conference

Conference2016 UKICRS Workshop & Symposium
CountryUnited Kingdom
CityCardiff
Period21/04/1622/04/16
Internet address

Fingerprint

Secondary Ion Mass Spectrometry
Secondary ion mass spectrometry
Complex Mixtures
Drug products
Pharmaceutical Preparations
Microstructure
Chemical analysis

Keywords

  • structure-property relationships
  • pharmaceutical manufacturing
  • tof-sims
  • spectrometry
  • pharmaceutical products

Cite this

Paladino, E., Watson, D. G., Passarelli, M. K., & Lamprou, D. A. (2016). Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences. Poster session presented at 2016 UKICRS Workshop & Symposium, Cardiff, United Kingdom.
Paladino, Eleonora ; Watson, David G. ; Passarelli, Melissa K. ; Lamprou, Dimitrios A. / Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences. Poster session presented at 2016 UKICRS Workshop & Symposium, Cardiff, United Kingdom.1 p.
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Paladino, E, Watson, DG, Passarelli, MK & Lamprou, DA 2016, 'Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences' 2016 UKICRS Workshop & Symposium, Cardiff, United Kingdom, 21/04/16 - 22/04/16, .

Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences. / Paladino, Eleonora; Watson, David G.; Passarelli, Melissa K.; Lamprou, Dimitrios A.

2016. Poster session presented at 2016 UKICRS Workshop & Symposium, Cardiff, United Kingdom.

Research output: Contribution to conferencePoster

TY - CONF

T1 - Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

AU - Paladino, Eleonora

AU - Watson, David G.

AU - Passarelli, Melissa K.

AU - Lamprou, Dimitrios A.

PY - 2016/4

Y1 - 2016/4

N2 - Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

AB - Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

KW - structure-property relationships

KW - pharmaceutical manufacturing

KW - tof-sims

KW - spectrometry

KW - pharmaceutical products

M3 - Poster

ER -

Paladino E, Watson DG, Passarelli MK, Lamprou DA. Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences. 2016. Poster session presented at 2016 UKICRS Workshop & Symposium, Cardiff, United Kingdom.