Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Wei Ding, Andriy V Gorbach, W.J. Wadswarth, Jonathan C Knight, D.V. Skryabin, Michael Strain, M. Sorel, R.M. De La Rue

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Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.
Original languageEnglish
Pages (from-to)26625-26630
Number of pages6
JournalOptics Express
Volume18
Issue number25
DOIs
Publication statusPublished - 6 Dec 2010

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Keywords

  • solitons
  • subwavelength silicon waveguides
  • waveguide

Cite this

Ding, W., Gorbach, A. V., Wadswarth, W. J., Knight, J. C., Skryabin, D. V., Strain, M., ... De La Rue, R. M. (2010). Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express, 18(25), 26625-26630. https://doi.org/10.1364/OE.18.026625