Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

W. Ding, A.V. Gorbach, W.J. Wadsworth, J.C. Knight, D.V. Skryabin, M.J. Strain, M. Sorel, R.M. De La Rue

Research output: Contribution to conferencePaper

Abstract

Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].

Conference

Conference2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011
CountryGermany
CityMunich
Period22/05/1126/05/11

Fingerprint

cross correlation
solitary waves
waveguides
silicon
insulators
photonics

Keywords

  • cross-correlation
  • Time-
  • frequency-domain measurements
  • solitons
  • subwavelength silicon waveguides

Cite this

Ding, W., Gorbach, A. V., Wadsworth, W. J., Knight, J. C., Skryabin, D. V., Strain, M. J., ... De La Rue, R. M. (2011). Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. Paper presented at 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, Munich, Germany. https://doi.org/10.1109/CLEOE.2011.5943163
Ding, W. ; Gorbach, A.V. ; Wadsworth, W.J. ; Knight, J.C. ; Skryabin, D.V. ; Strain, M.J. ; Sorel, M. ; De La Rue, R.M. / Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. Paper presented at 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, Munich, Germany.1 p.
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abstract = "Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].",
keywords = "cross-correlation, Time-, frequency-domain measurements, solitons, subwavelength silicon waveguides",
author = "W. Ding and A.V. Gorbach and W.J. Wadsworth and J.C. Knight and D.V. Skryabin and M.J. Strain and M. Sorel and {De La Rue}, R.M.",
year = "2011",
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note = "2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011 ; Conference date: 22-05-2011 Through 26-05-2011",

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Ding, W, Gorbach, AV, Wadsworth, WJ, Knight, JC, Skryabin, DV, Strain, MJ, Sorel, M & De La Rue, RM 2011, 'Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation' Paper presented at 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, Munich, Germany, 22/05/11 - 26/05/11, . https://doi.org/10.1109/CLEOE.2011.5943163

Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. / Ding, W.; Gorbach, A.V.; Wadsworth, W.J.; Knight, J.C.; Skryabin, D.V.; Strain, M.J.; Sorel, M.; De La Rue, R.M.

2011. Paper presented at 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, Munich, Germany.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

AU - Ding, W.

AU - Gorbach, A.V.

AU - Wadsworth, W.J.

AU - Knight, J.C.

AU - Skryabin, D.V.

AU - Strain, M.J.

AU - Sorel, M.

AU - De La Rue, R.M.

PY - 2011/1/1

Y1 - 2011/1/1

N2 - Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].

AB - Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].

KW - cross-correlation

KW - Time-

KW - frequency-domain measurements

KW - solitons

KW - subwavelength silicon waveguides

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U2 - 10.1109/CLEOE.2011.5943163

DO - 10.1109/CLEOE.2011.5943163

M3 - Paper

ER -

Ding W, Gorbach AV, Wadsworth WJ, Knight JC, Skryabin DV, Strain MJ et al. Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. 2011. Paper presented at 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, Munich, Germany. https://doi.org/10.1109/CLEOE.2011.5943163