Abstract
Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].
Original language | English |
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Number of pages | 1 |
DOIs | |
Publication status | Published - 1 Jan 2011 |
Event | 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011 - Munich, Germany Duration: 22 May 2011 → 26 May 2011 |
Conference
Conference | 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011 |
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Country/Territory | Germany |
City | Munich |
Period | 22/05/11 → 26/05/11 |
Keywords
- cross-correlation
- Time-
- frequency-domain measurements
- solitons
- subwavelength silicon waveguides