Thermal lensing, thermal management and transverse mode control in microchip VECSELs

A. Kemp, A.J. MacLean, J.E. Hastie, S.A. Smith, J.M. Hopkins, S. Calvez, G.J. Valentine, M.D. Dawson, D. Burns

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)


Finite-element analysis is used to explore the practicalities and power-scaling potential of quasi-monolithic microchip vertical-external-cavity surface-emitting lasers: thermal lensing and its implications for transverse mode control are emphasised. A comparison is made between the use of sapphire and diamond heat spreaders. The experimental characterisation of an InGaAs/sapphire microchip VECSEL is presented as an exemplar system and the factors affecting slope efficiency, threshold and output power roll-over are examined. By comparing experimental measurements with the finite-element model, the key role of thermal lensing in transverse mode control is demonstrated.
Original languageEnglish
Pages (from-to)189-194
Number of pages5
JournalApplied Physics B: Lasers and Optics
Publication statusPublished - 2006


  • applied physics
  • photonics
  • finite-element analysis
  • theremal lensing
  • optics


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