The impact of growth parameters on trench defects in InGaN/GaN quantum wells

F. C.P. Massabuau*, A. Le Fol, S. K. Pamenter, F. Oehler, M. J. Kappers, C. J. Humphreys, R. A. Oliver

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

The impact of the InGaN growth temperature and of the trimethylindium flux on trench defects has been investigated. We show that the density of defects is affected by both conditions but also their morphology and their emission properties. Therefore, the impact of such defect on the performance of quantum well structures can be controlled by adjusting these two growth conditions. Under usual conditions for making blue light emitting diodes, we observe that the enclosed region of the defect emits light at a longer wavelength. Nevertheless, our data also demonstrate that emission at a shorter wavelength is possible under certain growth conditions.

Original languageEnglish
Pages (from-to)740-743
Number of pages4
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume211
Issue number4
DOIs
Publication statusPublished - 1 Apr 2014

Keywords

  • atomic force microscopy
  • cathodoluminescence
  • defect
  • nitrides
  • trimethylindium flux
  • quantum well structures

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