The application of principal component analysis to study TSDC spectra

M.J. Given; R.A. Fouracre; H. Banford

doi:10.1109/CEIDP.2003.1254824

The application of principal component analysis to study TSDC spectra

M.J. Given, R.A. Fouracre, H. Banford

Electronic And Electrical Engineering

Research output: Contribution to conference › Paper

Abstract

The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

Original language	English
Pages	185-189
Number of pages	4
DOIs	https://doi.org/10.1109/CEIDP.2003.1254824
Publication status	Published - Oct 2003
Event	Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Albuquerque, United States Duration: 19 Oct 2003 → 22 Oct 2003

Conference

Conference	Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Country/Territory	United States
City	Albuquerque
Period	19/10/03 → 22/10/03

Keywords

application
principal component
analysis
study
tsdc spectra
aging
temperature
solids
principal component analysis
polyimides
inductors
history
dielectric measurements
current measurement
chemicals

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10.1109/CEIDP.2003.1254824

Cite this

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title = "The application of principal component analysis to study TSDC spectra",

abstract = "The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed. ",

keywords = "application, principal component, analysis, study, tsdc spectra, aging , temperature , solids, principal component analysis, polyimides, inductors, history, dielectric measurements, current measurement , chemicals",

author = "M.J. Given and R.A. Fouracre and H. Banford",

year = "2003",

month = oct,

doi = "10.1109/CEIDP.2003.1254824",

language = "English",

pages = "185--189",

note = "Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) ; Conference date: 19-10-2003 Through 22-10-2003",

}

TY - CONF

T1 - The application of principal component analysis to study TSDC spectra

AU - Given, M.J.

AU - Fouracre, R.A.

AU - Banford, H.

PY - 2003/10

Y1 - 2003/10

N2 - The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

AB - The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

KW - application

KW - principal component

KW - analysis

KW - study

KW - tsdc spectra

KW - aging

KW - temperature

KW - solids

KW - principal component analysis

KW - polyimides

KW - inductors

KW - history

KW - dielectric measurements

KW - current measurement

KW - chemicals

UR - http://dx.doi.org/10.1109/CEIDP.2003.1254824

U2 - 10.1109/CEIDP.2003.1254824

DO - 10.1109/CEIDP.2003.1254824

M3 - Paper

SP - 185

EP - 189

T2 - Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Y2 - 19 October 2003 through 22 October 2003

ER -

The application of principal component analysis to study TSDC spectra

Abstract

Conference

Keywords

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