The application of principal component analysis to study TSDC spectra

M.J. Given, R.A. Fouracre, H. Banford

Research output: Contribution to conferencePaper

Abstract

The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

Conference

ConferenceAnnual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
CountryUnited States
CityAlbuquerque
Period19/10/0322/10/03

Fingerprint

Principal component analysis
Electric current measurement
Polyimides
Aging of materials
Irradiation
Temperature

Keywords

  • application
  • principal component
  • analysis
  • study
  • tsdc spectra
  • aging
  • temperature
  • solids
  • principal component analysis
  • polyimides
  • inductors
  • history
  • dielectric measurements
  • current measurement
  • chemicals

Cite this

Given, M. J., Fouracre, R. A., & Banford, H. (2003). The application of principal component analysis to study TSDC spectra. 185-189. Paper presented at Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) , Albuquerque, United States. https://doi.org/10.1109/CEIDP.2003.1254824
Given, M.J. ; Fouracre, R.A. ; Banford, H. / The application of principal component analysis to study TSDC spectra. Paper presented at Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) , Albuquerque, United States.4 p.
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abstract = "The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.",
keywords = "application, principal component, analysis, study, tsdc spectra, aging , temperature , solids, principal component analysis, polyimides, inductors, history, dielectric measurements, current measurement , chemicals",
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year = "2003",
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note = "Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) ; Conference date: 19-10-2003 Through 22-10-2003",

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Given, MJ, Fouracre, RA & Banford, H 2003, 'The application of principal component analysis to study TSDC spectra' Paper presented at Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) , Albuquerque, United States, 19/10/03 - 22/10/03, pp. 185-189. https://doi.org/10.1109/CEIDP.2003.1254824

The application of principal component analysis to study TSDC spectra. / Given, M.J.; Fouracre, R.A.; Banford, H.

2003. 185-189 Paper presented at Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) , Albuquerque, United States.

Research output: Contribution to conferencePaper

TY - CONF

T1 - The application of principal component analysis to study TSDC spectra

AU - Given, M.J.

AU - Fouracre, R.A.

AU - Banford, H.

PY - 2003/10

Y1 - 2003/10

N2 - The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

AB - The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

KW - application

KW - principal component

KW - analysis

KW - study

KW - tsdc spectra

KW - aging

KW - temperature

KW - solids

KW - principal component analysis

KW - polyimides

KW - inductors

KW - history

KW - dielectric measurements

KW - current measurement

KW - chemicals

UR - http://dx.doi.org/10.1109/CEIDP.2003.1254824

U2 - 10.1109/CEIDP.2003.1254824

DO - 10.1109/CEIDP.2003.1254824

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ER -

Given MJ, Fouracre RA, Banford H. The application of principal component analysis to study TSDC spectra. 2003. Paper presented at Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) , Albuquerque, United States. https://doi.org/10.1109/CEIDP.2003.1254824