Testing analogue circuits with binary sequences: a feasibility study

M. Bekheit, D.J. Hamilton, B.P. Stimpson

Research output: Contribution to conference › Paper

Abstract

This paper provides a feasibility study of testing analogue circuits with binary sequences

Original language	English
Pages	83-87
Number of pages	5
Publication status	Published - 2002
Event	8th IEEE International Mixed Signal Testing Workshop - Montreux, Switzerland Duration: 1 Jan 2002 → …

Conference	8th IEEE International Mixed Signal Testing Workshop
Country/Territory	Switzerland
City	Montreux
Period	1/01/02 → …

@conference{06acc700bb604624b4f0e20e97c29f3e,

title = "Testing analogue circuits with binary sequences: a feasibility study",

abstract = "This paper provides a feasibility study of testing analogue circuits with binary sequences",

keywords = "testing, analogue circuits, binary sequences, feasibility study",

author = "M. Bekheit and D.J. Hamilton and B.P. Stimpson",

year = "2002",

language = "English",

pages = "83--87",

note = "8th IEEE International Mixed Signal Testing Workshop ; Conference date: 01-01-2002",

}

TY - CONF

T1 - Testing analogue circuits with binary sequences

T2 - 8th IEEE International Mixed Signal Testing Workshop

AU - Bekheit, M.

AU - Hamilton, D.J.

AU - Stimpson, B.P.

PY - 2002

Y1 - 2002

N2 - This paper provides a feasibility study of testing analogue circuits with binary sequences

AB - This paper provides a feasibility study of testing analogue circuits with binary sequences

KW - testing

KW - analogue circuits

KW - binary sequences

KW - feasibility study

M3 - Paper

SP - 83

EP - 87

Y2 - 1 January 2002

ER -