Testing analogue circuits with binary sequences: a feasibility study

M. Bekheit, D.J. Hamilton, B.P. Stimpson

Research output: Contribution to conferencePaper

Abstract

This paper provides a feasibility study of testing analogue circuits with binary sequences
LanguageEnglish
Pages83-87
Number of pages5
Publication statusPublished - 2002
Event8th IEEE International Mixed Signal Testing Workshop - Montreux, Switzerland
Duration: 1 Jan 2002 → …

Conference

Conference8th IEEE International Mixed Signal Testing Workshop
CountrySwitzerland
CityMontreux
Period1/01/02 → …

Fingerprint

Binary sequences
Analog circuits
Testing

Keywords

  • testing
  • analogue circuits
  • binary sequences
  • feasibility study

Cite this

Bekheit, M., Hamilton, D. J., & Stimpson, B. P. (2002). Testing analogue circuits with binary sequences: a feasibility study. 83-87. Paper presented at 8th IEEE International Mixed Signal Testing Workshop, Montreux, Switzerland.
Bekheit, M. ; Hamilton, D.J. ; Stimpson, B.P. / Testing analogue circuits with binary sequences : a feasibility study. Paper presented at 8th IEEE International Mixed Signal Testing Workshop, Montreux, Switzerland.5 p.
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Bekheit, M, Hamilton, DJ & Stimpson, BP 2002, 'Testing analogue circuits with binary sequences: a feasibility study' Paper presented at 8th IEEE International Mixed Signal Testing Workshop, Montreux, Switzerland, 1/01/02, pp. 83-87.

Testing analogue circuits with binary sequences : a feasibility study. / Bekheit, M.; Hamilton, D.J.; Stimpson, B.P.

2002. 83-87 Paper presented at 8th IEEE International Mixed Signal Testing Workshop, Montreux, Switzerland.

Research output: Contribution to conferencePaper

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Bekheit M, Hamilton DJ, Stimpson BP. Testing analogue circuits with binary sequences: a feasibility study. 2002. Paper presented at 8th IEEE International Mixed Signal Testing Workshop, Montreux, Switzerland.