Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

Ilka Schmueser; Ewen O. Blair; Ziya Isiksacan; Yifan Li; Damion K. Corrigan; Adam A. Stokes; Jonathan G. Terry; Andrew R. Mount; Anthony J. Walton

doi:10.1109/ICMTS48187.2020.9107930

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

Ilka Schmueser, Ewen O. Blair, Ziya Isiksacan, Yifan Li, Damion K. Corrigan, Adam A. Stokes, Jonathan G. Terry, Andrew R. Mount, Anthony J. Walton

Biomedical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

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Abstract

This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

Original language	English
Title of host publication	2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
Place of Publication	Piscataway, N.J.
Publisher	IEEE
Number of pages	6
ISBN (Electronic)	978-1-7281-4008-7
ISBN (Print)	978-1-7281-4009-4
DOIs	https://doi.org/10.1109/ICMTS48187.2020.9107930
Publication status	Published - 4 Jun 2020

Keywords

nanoelectrodes
microfabricated nanoelectrodes
3D printing technology

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10.1109/ICMTS48187.2020.9107930

Schmueser-etal-ICMTS-2020-Test-structure-and-measurement-system-for-characterising-the-electrochemicalAccepted author manuscript, 2.46 MB

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Schmueser, I., Blair, E. O., Isiksacan, Z., Li, Y., Corrigan, D. K., Stokes, A. A., Terry, J. G., Mount, A. R., & Walton, A. J. (2020). Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Article 4.4 IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107930

@inproceedings{86cb1ab6cb29476db1805965827ddce3,

title = "Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures",

abstract = "This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.",

keywords = "nanoelectrodes, microfabricated nanoelectrodes, 3D printing technology",

author = "Ilka Schmueser and Blair, {Ewen O.} and Ziya Isiksacan and Yifan Li and Corrigan, {Damion K.} and Stokes, {Adam A.} and Terry, {Jonathan G.} and Mount, {Andrew R.} and Walton, {Anthony J.}",

note = "{\textcopyright} 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.",

year = "2020",

month = jun,

day = "4",

doi = "10.1109/ICMTS48187.2020.9107930",

language = "English",

isbn = "978-1-7281-4009-4",

booktitle = "2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)",

publisher = "IEEE",

}

Schmueser, I, Blair, EO, Isiksacan, Z, Li, Y, Corrigan, DK, Stokes, AA, Terry, JG, Mount, AR & Walton, AJ 2020, Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)., 4.4, IEEE, Piscataway, N.J. https://doi.org/10.1109/ICMTS48187.2020.9107930

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. / Schmueser, Ilka; Blair, Ewen O.; Isiksacan, Ziya et al.
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, N.J.: IEEE, 2020. 4.4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

TY - GEN

T1 - Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

AU - Schmueser, Ilka

AU - Blair, Ewen O.

AU - Isiksacan, Ziya

AU - Li, Yifan

AU - Corrigan, Damion K.

AU - Stokes, Adam A.

AU - Terry, Jonathan G.

AU - Mount, Andrew R.

AU - Walton, Anthony J.

N1 - © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

PY - 2020/6/4

Y1 - 2020/6/4

N2 - This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

AB - This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

KW - nanoelectrodes

KW - microfabricated nanoelectrodes

KW - 3D printing technology

U2 - 10.1109/ICMTS48187.2020.9107930

DO - 10.1109/ICMTS48187.2020.9107930

M3 - Conference contribution book

SN - 978-1-7281-4009-4

BT - 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

PB - IEEE

CY - Piscataway, N.J.

ER -

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

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