Structural control of lithium fluoride thin films

O. G. Yazicigil; D. Rafik; V. Vorontsov; A. H. King

Structural control of lithium fluoride thin films

O. G. Yazicigil^*, D. Rafik, V. Vorontsov, A. H. King

^*Corresponding author for this work

Design, Manufacturing And Engineering Management

Research output: Contribution to conference › Proceeding › peer-review

2 Citations (Scopus)

Abstract

Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

Original language	English
Pages	351-356
Number of pages	6
Publication status	Published - 1 Dec 2005
Event	2005 Materials Research Society Spring Meeting - San Francisco, CA, United States Duration: 28 Mar 2005 → 1 Apr 2005

Conference

Conference	2005 Materials Research Society Spring Meeting
Country/Territory	United States
City	San Francisco, CA
Period	28/03/05 → 1/04/05

Keywords

thin films
annealing
lithium compounds
polycrystalline materials
lithium fluoride thin films

Cite this

@conference{8d0ab7fd5498494dbc01fe9d90c98610,

title = "Structural control of lithium fluoride thin films",

abstract = "Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.",

keywords = "thin films, annealing, lithium compounds, polycrystalline materials, lithium fluoride thin films",

author = "Yazicigil, {O. G.} and D. Rafik and V. Vorontsov and King, {A. H.}",

year = "2005",

month = dec,

day = "1",

language = "English",

pages = "351--356",

note = "2005 Materials Research Society Spring Meeting ; Conference date: 28-03-2005 Through 01-04-2005",

}

TY - CONF

T1 - Structural control of lithium fluoride thin films

AU - Yazicigil, O. G.

AU - Rafik, D.

AU - Vorontsov, V.

AU - King, A. H.

PY - 2005/12/1

Y1 - 2005/12/1

N2 - Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

AB - Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

KW - thin films

KW - annealing

KW - lithium compounds

KW - polycrystalline materials

KW - lithium fluoride thin films

UR - http://www.scopus.com/inward/record.url?scp=30644469805&partnerID=8YFLogxK

M3 - Proceeding

AN - SCOPUS:30644469805

SP - 351

EP - 356

T2 - 2005 Materials Research Society Spring Meeting

Y2 - 28 March 2005 through 1 April 2005

ER -

Structural control of lithium fluoride thin films

Abstract

Conference

Keywords

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