Structural control of lithium fluoride thin films

O. G. Yazicigil, D. Rafik, V. Vorontsov, A. H. King

Research output: Contribution to conferenceProceedingpeer-review

2 Citations (Scopus)


Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

Original languageEnglish
Number of pages6
Publication statusPublished - 1 Dec 2005
Event2005 Materials Research Society Spring Meeting - San Francisco, CA, United States
Duration: 28 Mar 20051 Apr 2005


Conference2005 Materials Research Society Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA


  • thin films
  • annealing
  • lithium compounds
  • polycrystalline materials
  • lithium fluoride thin films

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