Structural control of lithium fluoride thin films

O. G. Yazicigil, D. Rafik, V. Vorontsov, A. H. King

Research output: Contribution to conferenceProceedingpeer-review

Abstract

Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

Original languageEnglish
Pages351-356
Number of pages6
Publication statusPublished - 1 Dec 2005
Event2005 Materials Research Society Spring Meeting - San Francisco, CA, United States
Duration: 28 Mar 20051 Apr 2005

Conference

Conference2005 Materials Research Society Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period28/03/051/04/05

Keywords

  • thin films
  • annealing
  • lithium compounds
  • polycrystalline materials
  • lithium fluoride thin films

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