Structural control of lithium fluoride thin films

O. G. Yazicigil, D. Rafik, V. Vorontsov, A. H. King

Research output: Contribution to conferenceProceeding

Abstract

Polycrystalline lithium fluoride thin films have a number of existing and potential uses, but the optimization of their microstructure has not yet been addressed systematically. We have developed a means of measuring the porosity in LiF films, and a method for performing detailed electron-microscopical studies on this normally beam-sensitive material. These techniques have been applied to assess the structure of LiF films immediately after deposition from the vapor phase, and also after subsequent annealing.

Original languageEnglish
Pages351-356
Number of pages6
Publication statusPublished - 1 Dec 2005
Event2005 Materials Research Society Spring Meeting - San Francisco, CA, United States
Duration: 28 Mar 20051 Apr 2005

Conference

Conference2005 Materials Research Society Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period28/03/051/04/05

Keywords

  • thin films
  • annealing
  • lithium compounds
  • polycrystalline materials
  • lithium fluoride thin films

Fingerprint Dive into the research topics of 'Structural control of lithium fluoride thin films'. Together they form a unique fingerprint.

  • Cite this

    Yazicigil, O. G., Rafik, D., Vorontsov, V., & King, A. H. (2005). Structural control of lithium fluoride thin films. 351-356. 2005 Materials Research Society Spring Meeting, San Francisco, CA, United States.