Structural and optical properties of MOCVD AllnN epilayers

S. Hernandez, K. Wang, D. Amabile, E. Nogales, R. Cusco, D. Pastor, L. Artus, R.W. Martin, K.P. O'Donnell, I.M. Watson

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Abstract

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Original languageEnglish
Pages (from-to)388-393
JournalMRS Online Proceedings Library
Volume388-393
Issue number6
Publication statusPublished - 2005

Keywords

  • A1. Triple-axis X-ray diffraction
  • B1.
  • A3. Metalorganic chemical vapor deposition;
  • A1. Atomic force microscopy

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