Structural and optical properties of MOCVD AllnN epilayers

S. Hernandez, K. Wang, D. Amabile, E. Nogales, R. Cusco, D. Pastor, L. Artus, R.W. Martin, K.P. O'Donnell, I.M. Watson

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Abstract

7] M.-Y. Ryu, C.Q. Chen, E. Kuokstis, J.W. Yang,
G. Simin, M. Asif Khan, Appl. Phys. Lett. 80 (2002)
3730.
[8] D. Xu, Y. Wang, H. Yang, L. Zheng, J. Li, L. Duan,
R. Wu, Sci. China (a) 42 (1999) 517.
[9] H. Hirayama, A. Kinoshita, A. Hirata, Y. Aoyagi, Phys.
Stat. Sol. (a) 188 (2001) 83.
[10] Y. Chen, T. Takeuchi, H. Amano, I. Akasaki, N. Yamada,
Y. Kaneko, S.Y. Wang, Appl. Phys. Lett. 72 (1998) 710.
[11] Ig-Hyeon Kim, Hyeong-Soo Park, Yong-Jo Park, Taeil
Kim, Appl. Phys. Lett. 73 (1998) 1634.
[12] K. Watanabe, J.R. Yang, S.Y. Huang, K. Inoke, J.T. Hsu,
R.C. Tu, T. Yamazaki, N. Nakanishi, M. Shiojiri, Appl.
Phys. Lett. 82 (2003) 718.
Original languageEnglish
Pages (from-to)388-393
JournalMRS Online Proceedings Library
Volume388-393
Issue number6
Publication statusPublished - 2005

Keywords

  • A1. Triple-axis X-ray diffraction
  • B1.
  • A3. Metalorganic chemical vapor deposition;
  • A1. Atomic force microscopy

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