Statistical analysis of simultaneous partial sischarge measurements from IEC60270, HFCT and HFCT EMI methods

R. Gillie, A. Nesbitt, R. Ramirez-Iniguez, B. G. Stewart, G. Kerr

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

2 Citations (Scopus)

Abstract

This paper investigates correlations of Partial Discharge (PD) measurements of associated statistical parameters from phase-charge-number Φ-q-n plots from IEC60270 PD measurements and High Frequency Current Transformer (HFCT) Φ-peak-n plot PD measurements. These are also compared with Electromagnetic Interference (EMI) Radio Frequency (RF) measurements. The three methods record simultaneously PD activity from 3 artificially created fault geometries on High Voltage cable sections, namely a semiconductor point fault, a large embedded particle fault and a smaller particle fault. One of the research aims is to demonstrate the potential for passive RF methods to show comparable results of fault characteristics with direct contact PD measurements. The ability to identify faults based on statistical analysis of IEC60270 Φ-q-n plot and HFCT Φ-peak-n plot deduced quantities, such as Skewness and Kurtosis is also highlighted. This is used in comparison with EMI energy in selected frequency bands to determine any related frequency characteristic changes. Comparisons for trended Skewness and Kurtosis measurements of IEC60270 vs HFCT peak measurements for the three faults are shown for the pulse count Hn(Φ)+ distribution.

Original languageEnglish
Title of host publication33rd Electrical Insulation Conference, EIC 2015
Pages454-457
Number of pages4
ISBN (Electronic)9781479973521
DOIs
Publication statusPublished - 2015
Event33rd Electrical Insulation Conference, EIC 2015 - Seattle, United States
Duration: 7 Jun 201510 Jun 2015

Conference

Conference33rd Electrical Insulation Conference, EIC 2015
CountryUnited States
CitySeattle
Period7/06/1510/06/15

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Keywords

  • EMI
  • HFCT
  • IEC60270
  • partial discharges
  • statistical analysis
  • frequency measurement
  • semiconductor device measurement
  • electromagnetic interference
  • radio frequency

Cite this

Gillie, R., Nesbitt, A., Ramirez-Iniguez, R., Stewart, B. G., & Kerr, G. (2015). Statistical analysis of simultaneous partial sischarge measurements from IEC60270, HFCT and HFCT EMI methods. In 33rd Electrical Insulation Conference, EIC 2015 (pp. 454-457). [7223573] https://doi.org/10.1109/ICACACT.2014.7223573