Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

Adele Sassella, Riccardo Tubino, Alessandro Borghesi, Mario Ettore Giardini, Lorenzo Quadrelli

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented
polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.
LanguageEnglish
Pages347-350
Number of pages4
JournalThin Solid Films
Volume313-314
Issue number13 February
DOIs
Publication statusPublished - 1998

Fingerprint

Spectroscopic ellipsometry
ellipsometry
Potassium
potassium
Crystals
acids
Acids
crystals
Optical properties
Substrates
incidence
optical properties
Uncertainty

Keywords

  • potassium acid phtalate
  • spectroscopic ellipsometry
  • anisotropic crystals
  • ordinary refractive index
  • extraordinary refractive index

Cite this

Sassella, Adele ; Tubino, Riccardo ; Borghesi, Alessandro ; Giardini, Mario Ettore ; Quadrelli, Lorenzo. / Spectroscopic ellipsometry measurements on an anisotropic organic crystal : potassium acid phtalate. In: Thin Solid Films. 1998 ; Vol. 313-314, No. 13 February. pp. 347-350.
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Spectroscopic ellipsometry measurements on an anisotropic organic crystal : potassium acid phtalate. / Sassella, Adele; Tubino, Riccardo; Borghesi, Alessandro; Giardini, Mario Ettore; Quadrelli, Lorenzo.

In: Thin Solid Films, Vol. 313-314, No. 13 February, 1998, p. 347-350.

Research output: Contribution to journalArticle

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T2 - Thin Solid Films

AU - Sassella, Adele

AU - Tubino, Riccardo

AU - Borghesi, Alessandro

AU - Giardini, Mario Ettore

AU - Quadrelli, Lorenzo

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KW - potassium acid phtalate

KW - spectroscopic ellipsometry

KW - anisotropic crystals

KW - ordinary refractive index

KW - extraordinary refractive index

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M3 - Article

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JF - Thin Solid Films

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