Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

Adele Sassella; Riccardo Tubino; Alessandro Borghesi; Mario Ettore Giardini; Lorenzo Quadrelli

doi:10.1016/S0040-6090(97)00844-4

Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

Adele Sassella, Riccardo Tubino, Alessandro Borghesi, Mario Ettore Giardini, Lorenzo Quadrelli

Biomedical Engineering

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Abstract

Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented
polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.

Original language	English
Pages (from-to)	347-350
Number of pages	4
Journal	Thin Solid Films
Volume	313-314
Issue number	13 February
DOIs	https://doi.org/10.1016/S0040-6090(97)00844-4
Publication status	Published - 1998

Keywords

potassium acid phtalate
spectroscopic ellipsometry
anisotropic crystals
ordinary refractive index
extraordinary refractive index

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10.1016/S0040-6090(97)00844-4

Cite this

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title = "Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate",

abstract = "Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly orientedpolymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.",

keywords = "potassium acid phtalate, spectroscopic ellipsometry, anisotropic crystals, ordinary refractive index, extraordinary refractive index",

author = "Adele Sassella and Riccardo Tubino and Alessandro Borghesi and Giardini, {Mario Ettore} and Lorenzo Quadrelli",

year = "1998",

doi = "10.1016/S0040-6090(97)00844-4",

language = "English",

volume = "313-314",

pages = "347--350",

journal = "Thin Solid Films",

issn = "0040-6090",

number = "13 February",

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TY - JOUR

T1 - Spectroscopic ellipsometry measurements on an anisotropic organic crystal

T2 - potassium acid phtalate

AU - Sassella, Adele

AU - Tubino, Riccardo

AU - Borghesi, Alessandro

AU - Giardini, Mario Ettore

AU - Quadrelli, Lorenzo

PY - 1998

Y1 - 1998

N2 - Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly orientedpolymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.

AB - Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly orientedpolymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.

KW - potassium acid phtalate

KW - spectroscopic ellipsometry

KW - anisotropic crystals

KW - ordinary refractive index

KW - extraordinary refractive index

UR - http://www.sciencedirect.com/science/article/pii/S0040609097008444

U2 - 10.1016/S0040-6090(97)00844-4

DO - 10.1016/S0040-6090(97)00844-4

M3 - Article

SN - 0040-6090

VL - 313-314

SP - 347

EP - 350

JO - Thin Solid Films

JF - Thin Solid Films

IS - 13 February

ER -

Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

Abstract

Keywords

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