Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

Adele Sassella, Riccardo Tubino, Alessandro Borghesi, Mario Ettore Giardini, Lorenzo Quadrelli

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Abstract

Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented
polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.
Original languageEnglish
Pages (from-to)347-350
Number of pages4
JournalThin Solid Films
Volume313-314
Issue number13 February
DOIs
Publication statusPublished - 1998

Keywords

  • potassium acid phtalate
  • spectroscopic ellipsometry
  • anisotropic crystals
  • ordinary refractive index
  • extraordinary refractive index

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