Abstract
| Language | English |
|---|---|
| Pages | OP309–OP313 |
| Number of pages | 5 |
| Journal | Advanced Materials |
| Volume | 24 |
| Issue number | 44 |
| DOIs | |
| Publication status | Published - 12 Sep 2012 |
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Keywords
- far-field optical imaging
- solid immersion lenses (SIL)
- stimulated emission depletion (STED) microscopy
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Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization. / Wildanger, Dominik; Patton, Brian R; Schill, Heiko; Marseglia, Luca; Hadden, JP; Knauer, Sebastian; Schönle, Andreas; Rarity, John G; O'Brien, Jeremy L; Hell, Stefan W.
In: Advanced Materials, Vol. 24, No. 44, 12.09.2012, p. OP309–OP313.Research output: Contribution to journal › Article
TY - JOUR
T1 - Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization
AU - Wildanger, Dominik
AU - Patton, Brian R
AU - Schill, Heiko
AU - Marseglia, Luca
AU - Hadden, JP
AU - Knauer, Sebastian
AU - Schönle, Andreas
AU - Rarity, John G
AU - O'Brien, Jeremy L
AU - Hell, Stefan W
PY - 2012/9/12
Y1 - 2012/9/12
N2 - Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
AB - Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
KW - far-field optical imaging
KW - solid immersion lenses (SIL)
KW - stimulated emission depletion (STED) microscopy
U2 - 10.1002/adma.201203033
DO - 10.1002/adma.201203033
M3 - Article
VL - 24
SP - OP309–OP313
JO - Advanced Materials
T2 - Advanced Materials
JF - Advanced Materials
SN - 1521-4095
IS - 44
ER -