Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization

Dominik Wildanger; Brian R Patton; Heiko Schill; Luca Marseglia; JP Hadden; Sebastian Knauer; Andreas Schönle; John G Rarity; Jeremy L O'Brien; Stefan W Hell

doi:10.1002/adma.201203033

Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization

Dominik Wildanger, Brian R Patton, Heiko Schill, Luca Marseglia, JP Hadden, Sebastian Knauer, Andreas Schönle, John G Rarity, Jeremy L O'Brien, Stefan W Hell

Physics

Research output: Contribution to journal › Article

85 Citations (Scopus)

Abstract

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Original language	English
Pages (from-to)	OP309–OP313
Number of pages	5
Journal	Advanced Materials
Volume	24
Issue number	44
DOIs	https://doi.org/10.1002/adma.201203033
Publication status	Published - 12 Sep 2012

Keywords

far-field optical imaging
solid immersion lenses (SIL)
stimulated emission depletion (STED) microscopy

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10.1002/adma.201203033

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Wildanger, D., Patton, B. R., Schill, H., Marseglia, L., Hadden, JP., Knauer, S., ... Hell, S. W. (2012). Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization. Advanced Materials, 24(44), OP309–OP313. https://doi.org/10.1002/adma.201203033

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abstract = "Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.",

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Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization. / Wildanger, Dominik; Patton, Brian R; Schill, Heiko; Marseglia, Luca; Hadden, JP; Knauer, Sebastian; Schönle, Andreas; Rarity, John G; O'Brien, Jeremy L; Hell, Stefan W.

In: Advanced Materials, Vol. 24, No. 44, 12.09.2012, p. OP309–OP313.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization

AU - Wildanger, Dominik

AU - Patton, Brian R

AU - Schill, Heiko

AU - Marseglia, Luca

AU - Hadden, JP

AU - Knauer, Sebastian

AU - Schönle, Andreas

AU - Rarity, John G

AU - O'Brien, Jeremy L

AU - Hell, Stefan W

PY - 2012/9/12

Y1 - 2012/9/12

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AB - Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

KW - far-field optical imaging

KW - solid immersion lenses (SIL)

KW - stimulated emission depletion (STED) microscopy

U2 - 10.1002/adma.201203033

DO - 10.1002/adma.201203033

M3 - Article

VL - 24

SP - OP309–OP313

JO - Advanced Materials

JF - Advanced Materials

SN - 1521-4095

IS - 44

ER -