Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization

Dominik Wildanger, Brian R Patton, Heiko Schill, Luca Marseglia, JP Hadden, Sebastian Knauer, Andreas Schönle, John G Rarity, Jeremy L O'Brien, Stefan W Hell

Research output: Contribution to journalArticle

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Abstract

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
LanguageEnglish
PagesOP309–OP313
Number of pages5
JournalAdvanced Materials
Volume24
Issue number44
DOIs
Publication statusPublished - 12 Sep 2012

Fingerprint

Stimulated emission
Fluorescence microscopy
stimulated emission
submerging
far fields
Lenses
Microscopic examination
emitters
depletion
spatial resolution
lenses
microscopy
Imaging techniques
fluorescence

Keywords

  • far-field optical imaging
  • solid immersion lenses (SIL)
  • stimulated emission depletion (STED) microscopy

Cite this

Wildanger, Dominik ; Patton, Brian R ; Schill, Heiko ; Marseglia, Luca ; Hadden, JP ; Knauer, Sebastian ; Schönle, Andreas ; Rarity, John G ; O'Brien, Jeremy L ; Hell, Stefan W. / Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization. In: Advanced Materials. 2012 ; Vol. 24, No. 44. pp. OP309–OP313.
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Wildanger, D, Patton, BR, Schill, H, Marseglia, L, Hadden, JP, Knauer, S, Schönle, A, Rarity, JG, O'Brien, JL & Hell, SW 2012, 'Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization' Advanced Materials, vol. 24, no. 44, pp. OP309–OP313. https://doi.org/10.1002/adma.201203033

Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization. / Wildanger, Dominik; Patton, Brian R; Schill, Heiko; Marseglia, Luca; Hadden, JP; Knauer, Sebastian; Schönle, Andreas; Rarity, John G; O'Brien, Jeremy L; Hell, Stefan W.

In: Advanced Materials, Vol. 24, No. 44, 12.09.2012, p. OP309–OP313.

Research output: Contribution to journalArticle

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AU - Patton, Brian R

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AU - Marseglia, Luca

AU - Hadden, JP

AU - Knauer, Sebastian

AU - Schönle, Andreas

AU - Rarity, John G

AU - O'Brien, Jeremy L

AU - Hell, Stefan W

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KW - far-field optical imaging

KW - solid immersion lenses (SIL)

KW - stimulated emission depletion (STED) microscopy

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DO - 10.1002/adma.201203033

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JO - Advanced Materials

T2 - Advanced Materials

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