Single pixel optical imaging using a scanning MEMS mirror

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The paper describes a low-complexity optical imaging system using demagnifying optics, a single scanning MEMS mirror and a single photodetector. Light at visible wavelengths from the object passes through a lens assembly and is incident on a scanning MEMS micromirror. After reflection from the micromirror, a complete image of the object is projected at the image plane of the optical system where a single-element photodetector with a pinhole at its entrance is located. By tilting the micromirror in the x and y directions, the projected image is translated across the image plane in the x and y directions. The photodetector sequentially detects the intensity of different areas of the projected optical image, thereby enabling a digital image to be generated pixel-by-pixel. However, due to the noisy raw image obtained experimentally, an image enhancement algorithm based on iterative-combined wavelet and curvelet denoising has been developed. Using blind image quality indices (BIQI) as an objective performance measure, it is shown that the proposed image enhancement method enhances the raw image by up to 40% and outperforms state-of-the-art denoising methods for up to 10 units of BIQI.


LanguageEnglish
Article number025022
Number of pages9
JournalJournal of Micromechanics and Microengineering
Volume21
Issue number2
DOIs
Publication statusPublished - 27 Jan 2011

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Photodetectors
MEMS
Mirrors
Image enhancement
Pixels
Scanning
Imaging techniques
Image quality
Optical systems
Imaging systems
Lenses
Optics
Wavelength
Direction compound

Keywords

  • integrated optics
  • mirrors
  • MEMS mirror
  • optical imaging

Cite this

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title = "Single pixel optical imaging using a scanning MEMS mirror",
abstract = "The paper describes a low-complexity optical imaging system using demagnifying optics, a single scanning MEMS mirror and a single photodetector. Light at visible wavelengths from the object passes through a lens assembly and is incident on a scanning MEMS micromirror. After reflection from the micromirror, a complete image of the object is projected at the image plane of the optical system where a single-element photodetector with a pinhole at its entrance is located. By tilting the micromirror in the x and y directions, the projected image is translated across the image plane in the x and y directions. The photodetector sequentially detects the intensity of different areas of the projected optical image, thereby enabling a digital image to be generated pixel-by-pixel. However, due to the noisy raw image obtained experimentally, an image enhancement algorithm based on iterative-combined wavelet and curvelet denoising has been developed. Using blind image quality indices (BIQI) as an objective performance measure, it is shown that the proposed image enhancement method enhances the raw image by up to 40{\%} and outperforms state-of-the-art denoising methods for up to 10 units of BIQI.",
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author = "Li Li and Vladimir Stankovic and Lina Stankovic and Lijie Li and S. Cheng and Deepak Uttamchandani",
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Single pixel optical imaging using a scanning MEMS mirror. / Li, Li; Stankovic, Vladimir; Stankovic, Lina; Li, Lijie; Cheng, S.; Uttamchandani, Deepak.

In: Journal of Micromechanics and Microengineering, Vol. 21, No. 2, 025022, 27.01.2011.

Research output: Contribution to journalArticle

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