Projects per year
Abstract
Original language | English |
---|---|
Article number | 395704 |
Number of pages | 8 |
Journal | Nanotechnology |
Volume | 35 |
Issue number | 39 |
Early online date | 2 Jul 2024 |
DOIs | |
Publication status | Published - 23 Sept 2024 |
Keywords
- scanning electron microscopy modes
- deep-ultraviolet micro-LED
- beam damage effects
Fingerprint
Dive into the research topics of 'Simultaneous mapping of cathodoluminescence spectra and backscatter diffraction patterns in a scanning electron microscope'. Together they form a unique fingerprint.Projects
- 2 Finished
-
'Hetero-print': A holistic approach to transfer-printing for heterogeneous integration in manufacturing
Dawson, M. (Principal Investigator), Martin, R. (Co-investigator), Strain, M. (Co-investigator), Watson, I. (Co-investigator) & Guilhabert, B. J. E. (Research Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/06/18 → 31/05/24
Project: Research
-
Light-controlled manufacturing of semiconductor structures: a platform for next generation processing of photonic devices
Martin, R. (Principal Investigator), Dawson, M. (Co-investigator), Edwards, P. (Co-investigator), Skabara, P. (Co-investigator) & Watson, I. (Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/07/17 → 31/07/22
Project: Research
Datasets
-
Simultaneously acquired maps of electron backscattered diffraction patterns and cathodoluminescence spectra from an ultraviolet micro-light-emitting diode
Edwards, P. (Creator), Gunasekar, N. (Creator) & Martin, R. (Creator), University of Strathclyde, 11 Jun 2024
DOI: 10.15129/62ff6ef5-c084-422f-b180-0b50b2927fe8
Dataset