Simultaneous improved performance and thermal stability of planar metal ion incorporated CsPbI2Br all-inorganic perovskite solar cells based on MgZnO nanocrystalline electron transporting layer

Sawanta S. Mali*, Jyoti V. Patil, Chang Kook Hong

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

70 Citations (Scopus)

Abstract

The high thermal stability and facile synthesis of CsPbI2Br all-inorganic perovskite solar cells (AI-PSCs) have attracted tremendous attention. As far as electron-transporting layers (ETLs) are concerned, low temperature processing and reduced interfacial recombination centers through tunable energy levels determine the feasibility of the perovskite devices. Although the TiO2 is the most popular ETL used in PSCs, its processing temperature and moderate electron mobility hamper the performance and feasibility. Herein, the highly stable, low-temperature processed MgZnO nanocrystal-based ETLs for dynamic hot-air processed Mn2+ incorporated CsPbI2Br AI-PSCs are reported. By holding its regular planar “n–i–p” type device architecture, the MgZnO ETL and poly(3-hexylthiophene-2,5-diyl) hole transporting layer, 15.52% power conversion efficiency (PCE) is demonstrated. The thermal-stability analysis reveals that the conventional ZnO ETL-based AI-PSCs show a serious instability and poor efficiency than the Mg2+ modified MgZnO ETLs. The photovoltaic and stability analysis of this improved photovoltaic performance is attributed to the suitable wide-bandgap, low ETL/perovskite interface recombination, and interface stability by Mg2+ doping. Interestingly, the thermal stability analysis of the unencapsulated AI-PSCs maintains >95% of initial PCE more than 400 h at 85 °C for MgZnO ETL, revealing the suitability against thermal degradation than conventional ZnO ETL.

Original languageEnglish
Article number1902708
Number of pages13
JournalAdvanced Energy Materials
Volume10
Issue number3
Early online date2 Dec 2019
DOIs
Publication statusPublished - 21 Jan 2020

Funding

This work was supported by Korea Research Fellowship Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and Future Planning (2016H1D3A1909289) for an outstanding overseas young researcher. This research was also supported by the National Research Foundation of Korea (NRF) (NRF-2017R1A2B4008117). This work was also supported by Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2018R1A6A1A03024334). This work was also supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2018R1C1B6008218). S.S.M. and C.K.H. contributed to the conception and design of the experiments. S.S.M. fabricated all the devices and conducted most of the characterizations. S.S.M. and J.V.P. measured the EQE and UV–vis spectra. S.S.M. and C.K.H. wrote the paper. All authors discussed the results and reviewed the manuscript.

Keywords

  • degradation
  • MgZnO electron transporting layer
  • Mn incorporated CsPbIBr

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