Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

Research output: Contribution to journalConference article

Abstract

Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations.

LanguageEnglish
Pages293-296
Number of pages4
JournalDesign and Nature
Volume6
Publication statusPublished - 17 Nov 2004
EventDesign and Nature II: Comparing Design in Nature with Science and Engineering - Rhodes, Greece
Duration: 28 Jun 200430 Jun 2004

Fingerprint

Cathodoluminescence
cathodoluminescence
Nitrides
Indium
nitrides
indium
Gallium nitride
gallium nitrides
Chemical analysis
Wavelength
Metallorganic vapor phase epitaxy
Epilayers
Microanalysis
microanalysis
wavelengths
Luminescence
luminescence
X rays
shift
x rays

Keywords

  • electron probe microanalyzers (EPMA)
  • emission energy
  • spatial resolution
  • X-ray microanalysis
  • Gallium nitride
  • semiconductor quantum dots
  • cathodoluminescence
  • electroluminescence
  • microanalysis

Cite this

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title = "Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures",
abstract = "Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations.",
keywords = "electron probe microanalyzers (EPMA), emission energy, spatial resolution, X-ray microanalysis, Gallium nitride, semiconductor quantum dots, cathodoluminescence, electroluminescence, microanalysis",
author = "Edwards, {P. R.} and Martin, {R. W.} and O'Donnell, {K. P.} and Watson, {I. M.}",
year = "2004",
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day = "17",
language = "English",
volume = "6",
pages = "293--296",
journal = "Design and Nature",
issn = "1478-0585",
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TY - JOUR

T1 - Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

AU - Edwards, P. R.

AU - Martin, R. W.

AU - O'Donnell, K. P.

AU - Watson, I. M.

PY - 2004/11/17

Y1 - 2004/11/17

N2 - Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations.

AB - Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations.

KW - electron probe microanalyzers (EPMA)

KW - emission energy

KW - spatial resolution

KW - X-ray microanalysis

KW - Gallium nitride

KW - semiconductor quantum dots

KW - cathodoluminescence

KW - electroluminescence

KW - microanalysis

UR - http://www.scopus.com/inward/record.url?scp=7744238598&partnerID=8YFLogxK

M3 - Conference article

VL - 6

SP - 293

EP - 296

JO - Design and Nature

T2 - Design and Nature

JF - Design and Nature

SN - 1478-0585

ER -