Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

Research output: Contribution to journalConference article

Abstract

Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations.

Original languageEnglish
Pages (from-to)293-296
Number of pages4
JournalDesign and Nature
Volume6
Publication statusPublished - 17 Nov 2004
EventDesign and Nature II: Comparing Design in Nature with Science and Engineering - Rhodes, Greece
Duration: 28 Jun 200430 Jun 2004

Keywords

  • electron probe microanalyzers (EPMA)
  • emission energy
  • spatial resolution
  • X-ray microanalysis
  • Gallium nitride
  • semiconductor quantum dots
  • cathodoluminescence
  • electroluminescence
  • microanalysis

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