Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

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Abstract

Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations
LanguageEnglish
Pages293-296
Number of pages4
JournalJournal of Physics: Conference Series
Issue number180
Publication statusPublished - 2003

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cathodoluminescence
nitrides
indium
gallium nitrides
microanalysis
wavelengths
luminescence
shift
x rays
energy

Keywords

  • microscopy
  • cathodoluminescence
  • spectral mapping

Cite this

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title = "Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures",
abstract = "Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations",
keywords = "microscopy, cathodoluminescence , spectral mapping",
author = "P.R. Edwards and R.W. Martin and K.P. O'Donnell and I.M. Watson",
year = "2003",
language = "English",
pages = "293--296",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
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T1 - Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

AU - Edwards, P.R.

AU - Martin, R.W.

AU - O'Donnell, K.P.

AU - Watson, I.M.

PY - 2003

Y1 - 2003

N2 - Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations

AB - Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations

KW - microscopy

KW - cathodoluminescence

KW - spectral mapping

M3 - Article

SP - 293

EP - 296

JO - Journal of Physics: Conference Series

T2 - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 180

ER -