Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures

Research output: Contribution to journalArticle

Abstract

Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations
Original languageEnglish
Pages (from-to)293-296
Number of pages4
JournalJournal of Physics: Conference Series
Issue number180
Publication statusPublished - 2003

    Fingerprint

Keywords

  • microscopy
  • cathodoluminescence
  • spectral mapping

Cite this