Abstract
Cell response to sub-microsecond pulsed electric fields (sm-PEF) is examined using an equivalent circuit model (ECM) where a network of electrical components is used to represent the cell environment and the cell with its internal structures. The model is evaluated by comparing results with published data from other numerical studies. It is shown that the model, which is not computationally demanding, may be usefully adopted to examine cell and organelle response in vitro, and where the applied pulse shape and frequency spectrum may be of significance.
Original language | English |
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Pages | 377-380 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 2005 |
Event | Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on - Nashville, Tennessee, United States Duration: 16 Oct 2005 → 19 Oct 2005 |
Conference
Conference | Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on |
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Country/Territory | United States |
City | Nashville, Tennessee |
Period | 16/10/05 → 19/10/05 |
Keywords
- sub-microsecond pulsed electric fields (sm-PEF)
- equivalent circuit model (ECM)
- intracellular structures
- biological cells
- cell and organelle response
- in vitro