Simulated pulse response of intracellular structures in biological cells exposed to high-intensity sub-microsecond pulsed electric fields

R. Campbell, B.H. Crichton, R.A. Fouracre, M.D. Judd

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Cell response to sub-microsecond pulsed electric fields (sm-PEF) is examined using an equivalent circuit model (ECM) where a network of electrical components is used to represent the cell environment and the cell with its internal structures. The model is evaluated by comparing results with published data from other numerical studies. It is shown that the model, which is not computationally demanding, may be usefully adopted to examine cell and organelle response in vitro, and where the applied pulse shape and frequency spectrum may be of significance.
Original languageEnglish
Pages377-380
Number of pages4
DOIs
Publication statusPublished - 2005
EventElectrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on - Nashville, Tennessee, United States
Duration: 16 Oct 200519 Oct 2005

Conference

ConferenceElectrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
CountryUnited States
CityNashville, Tennessee
Period16/10/0519/10/05

Keywords

  • sub-microsecond pulsed electric fields (sm-PEF)
  • equivalent circuit model (ECM)
  • intracellular structures
  • biological cells
  • cell and organelle response
  • in vitro

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    Campbell, R., Crichton, B. H., Fouracre, R. A., & Judd, M. D. (2005). Simulated pulse response of intracellular structures in biological cells exposed to high-intensity sub-microsecond pulsed electric fields. 377-380. Paper presented at Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on, Nashville, Tennessee, United States. https://doi.org/10.1109/CEIDP.2005.1560700