Second harmonic generation in the characterisation of epitaxial CdxHg1-xTe (CMT) (111) surfaces

L.E.A. Berlouis; A.W. Wark; F.R. Cruickshank; R. Antoine; P. Galletto; Pierre-Francois Brevet; H.H. Girault; S.C. Gupta; F.R. Chavada; A.K. Garg

doi:10.1016/S0022-0248(98)80144-9

Second harmonic generation in the characterisation of epitaxial CdxHg1-xTe (CMT) (111) surfaces

L.E.A. Berlouis, A.W. Wark, F.R. Cruickshank, R. Antoine, P. Galletto, Pierre-Francois Brevet, H.H. Girault, S.C. Gupta, F.R. Chavada, A.K. Garg

Pure And Applied Chemistry

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Second-harmonic (SH) rotation anisotropy measurements have been performed for the first time on epitaxial CMT layers grown on CdTe〈1 1 1〉 B substrate. The CMT response shows a strong surface contribution to the SH signal. This modification of the SH response from a non-centrosymmetric II–VI material has not been previously reported since bulk SH generation has always been considered as the dominant contributor in these instances. The difference in the case of the CMT however is that the observed SH signal orginates from, at most, only the top 30 nm of the CMT epilayer.

Original language	English
Pages (from-to)	691-695
Number of pages	5
Journal	Journal of Crystal Growth
Volume	184-185
DOIs	https://doi.org/10.1016/S0022-0248(98)80144-9
Publication status	Published - Feb 1998

Keywords

second harmonic generation
characterisation
epitaxial CdxHg1-xTe (CMT) (111) surfaces

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10.1016/S0022-0248(98)80144-9

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title = "Second harmonic generation in the characterisation of epitaxial CdxHg1-xTe (CMT) (111) surfaces",

abstract = "Second-harmonic (SH) rotation anisotropy measurements have been performed for the first time on epitaxial CMT layers grown on CdTe〈1 1 1〉 B substrate. The CMT response shows a strong surface contribution to the SH signal. This modification of the SH response from a non-centrosymmetric II–VI material has not been previously reported since bulk SH generation has always been considered as the dominant contributor in these instances. The difference in the case of the CMT however is that the observed SH signal orginates from, at most, only the top 30 nm of the CMT epilayer.",

keywords = "second harmonic generation, characterisation, epitaxial CdxHg1-xTe (CMT) (111) surfaces",

author = "L.E.A. Berlouis and A.W. Wark and F.R. Cruickshank and R. Antoine and P. Galletto and Pierre-Francois Brevet and H.H. Girault and S.C. Gupta and F.R. Chavada and A.K. Garg",

year = "1998",

month = feb,

doi = "10.1016/S0022-0248(98)80144-9",

language = "English",

volume = "184-185",

pages = "691--695",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Second harmonic generation in the characterisation of epitaxial CdxHg1-xTe (CMT) (111) surfaces

AU - Berlouis, L.E.A.

AU - Wark, A.W.

AU - Cruickshank, F.R.

AU - Antoine, R.

AU - Galletto, P.

AU - Brevet, Pierre-Francois

AU - Girault, H.H.

AU - Gupta, S.C.

AU - Chavada, F.R.

AU - Garg, A.K.

PY - 1998/2

Y1 - 1998/2

N2 - Second-harmonic (SH) rotation anisotropy measurements have been performed for the first time on epitaxial CMT layers grown on CdTe〈1 1 1〉 B substrate. The CMT response shows a strong surface contribution to the SH signal. This modification of the SH response from a non-centrosymmetric II–VI material has not been previously reported since bulk SH generation has always been considered as the dominant contributor in these instances. The difference in the case of the CMT however is that the observed SH signal orginates from, at most, only the top 30 nm of the CMT epilayer.

AB - Second-harmonic (SH) rotation anisotropy measurements have been performed for the first time on epitaxial CMT layers grown on CdTe〈1 1 1〉 B substrate. The CMT response shows a strong surface contribution to the SH signal. This modification of the SH response from a non-centrosymmetric II–VI material has not been previously reported since bulk SH generation has always been considered as the dominant contributor in these instances. The difference in the case of the CMT however is that the observed SH signal orginates from, at most, only the top 30 nm of the CMT epilayer.

KW - second harmonic generation

KW - characterisation

KW - epitaxial CdxHg1-xTe (CMT) (111) surfaces

U2 - 10.1016/S0022-0248(98)80144-9

DO - 10.1016/S0022-0248(98)80144-9

M3 - Article

SN - 0022-0248

VL - 184-185

SP - 691

EP - 695

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

ER -

Second harmonic generation in the characterisation of epitaxial CdxHg1-xTe (CMT) (111) surfaces

Abstract

Keywords

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