Second harmonic generation by reflection from vicinal surfaces of epitaxial layers of cadmium mercury telluride

A.W. Wark, David Pugh, L.E.A. Berlouis, F.R. Cruickshank, P.F. Brevet

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Reflection second harmonic generation is employed to examine the surfaces of epitaxial layers of CdxHg1-xTe (CMT) grown on vicinal GaAs (100) substrates. Different vicinal tilts, with respect to the GaAs substrates, are observed in the epitaxial CMT layers. We also report here on the measurement of the second-order nonlinear coefficient (d36) of CMT. Because CMT is strongly absorbing at the 1.06 µm wavelength, this measurement was performed by comparing the second harmonic intensity reflected from the CMT surface to that measured for a quartz sample in transmission. Directly comparable expressions for the reflected and transmitted second harmonic intensities are derived from which a value of d36 = 365±15 pm V-1 is obtained. This value is much larger than those reported for similar zinc-blende-type materials and is attributed to an electronic resonance enhancement.
Original languageEnglish
Pages (from-to)1712-1716
Number of pages5
JournalJournal of Physics D: Applied Physics
Volume34
Issue number11
DOIs
Publication statusPublished - 2001

Keywords

  • second harmonic generation
  • reflection
  • vicinal surfaces
  • cadmium mercury telluride
  • epitaxial layers

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