Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms

B. Zhang, C. Henkel, E. Haller, S. Wildermuth, S. Hofferberth, P. Krüger, J. Schmiedmayer

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the centre of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a, much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.
LanguageEnglish
Pages97-104
Number of pages8
JournalEuropean Physical Journal D: Atomic, Molecular, Optical and Plasma Physics
Volume35
Issue number1
DOIs
Publication statusPublished - 1 Aug 2005

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chips
life (durability)
atoms
noise spectra
scaling laws
Green's functions
traps
wire
membranes
reflectance
conductivity
vacuum

Keywords

  • magnetically trapped atoms
  • magnetic noise

Cite this

Zhang, B. ; Henkel, C. ; Haller, E. ; Wildermuth, S. ; Hofferberth, S. ; Krüger, P. ; Schmiedmayer, J. / Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms. In: European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics. 2005 ; Vol. 35, No. 1. pp. 97-104.
@article{56e63a67f2a14f9c9a4b2198eed0d1fc,
title = "Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms",
abstract = "We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the centre of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a, much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.",
keywords = "magnetically trapped atoms, magnetic noise",
author = "B. Zhang and C. Henkel and E. Haller and S. Wildermuth and S. Hofferberth and P. Kr{\"u}ger and J. Schmiedmayer",
year = "2005",
month = "8",
day = "1",
doi = "10.1140/epjd/e2005-00227-1",
language = "English",
volume = "35",
pages = "97--104",
journal = "European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics",
issn = "1434-6060",
number = "1",

}

Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms. / Zhang, B.; Henkel, C.; Haller, E.; Wildermuth, S.; Hofferberth, S.; Krüger, P.; Schmiedmayer, J.

In: European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics, Vol. 35, No. 1, 01.08.2005, p. 97-104.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms

AU - Zhang, B.

AU - Henkel, C.

AU - Haller, E.

AU - Wildermuth, S.

AU - Hofferberth, S.

AU - Krüger, P.

AU - Schmiedmayer, J.

PY - 2005/8/1

Y1 - 2005/8/1

N2 - We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the centre of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a, much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.

AB - We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the centre of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a, much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.

KW - magnetically trapped atoms

KW - magnetic noise

UR - http://www.springerlink.com/index/10.1140/epjd/e2005-00227-1

U2 - 10.1140/epjd/e2005-00227-1

DO - 10.1140/epjd/e2005-00227-1

M3 - Article

VL - 35

SP - 97

EP - 104

JO - European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics

T2 - European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics

JF - European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics

SN - 1434-6060

IS - 1

ER -