Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications

K.C. Ruxton, A. Chakraborty, A.J. McGettrick, K. Duffin, G. Stewart

Research output: Contribution to conferencePaper

4 Citations (Scopus)

Abstract

A limiting factor of tuneable diode laser spectroscopy (TDLS) with wavelength modulation spectroscopy (WMS) is the presence of background residual amplitude modulation (RAM) on the recovered 1st harmonic signal. The presence of this background term is due to direct modulation of the source laser power. This work presents a novel method to optically remove the unwanted background, with the major benefit being that measurement sensitivity can be increased. The recently developed phasor decomposition method1 (PDM), is a near IR (NIR) TDLS analysis technique that is used with the addition of the new RAM nulling method to recover gas absorption line-shapes. The PDM is a calibration free approach, which recovers the gas absorption line-shape and the isolated 1st derivative of the line-shape from the 1st harmonic signal. The work presented illustrates and validates the new RAM nulling procedure with measurements examining the 1650.96nm absorption line of methane (CH4) with comparisons to theory.

Conference

Conference20th International Conference on Optical Fibre Sensors
CountryUnited Kingdom
CityEdinburgh
Period5/10/09 → …

Fingerprint

laser spectroscopy
line shape
diodes
harmonics
modulation
decomposition
gases
methane
wavelengths
spectroscopy
lasers

Keywords

  • tuneable diode laser spectroscopy
  • TDLS
  • wavelength modulation spectroscopy
  • WMS
  • residual amplitude modulation
  • RAM

Cite this

Ruxton, K. C., Chakraborty, A., McGettrick, A. J., Duffin, K., & Stewart, G. (2009). Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications. Paper presented at 20th International Conference on Optical Fibre Sensors , Edinburgh, United Kingdom. https://doi.org/10.1117/12.833000
Ruxton, K.C. ; Chakraborty, A. ; McGettrick, A.J. ; Duffin, K. ; Stewart, G. / Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications. Paper presented at 20th International Conference on Optical Fibre Sensors , Edinburgh, United Kingdom.
@conference{6af73898c8914ca2afaed70ae11c8739,
title = "Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications",
abstract = "A limiting factor of tuneable diode laser spectroscopy (TDLS) with wavelength modulation spectroscopy (WMS) is the presence of background residual amplitude modulation (RAM) on the recovered 1st harmonic signal. The presence of this background term is due to direct modulation of the source laser power. This work presents a novel method to optically remove the unwanted background, with the major benefit being that measurement sensitivity can be increased. The recently developed phasor decomposition method1 (PDM), is a near IR (NIR) TDLS analysis technique that is used with the addition of the new RAM nulling method to recover gas absorption line-shapes. The PDM is a calibration free approach, which recovers the gas absorption line-shape and the isolated 1st derivative of the line-shape from the 1st harmonic signal. The work presented illustrates and validates the new RAM nulling procedure with measurements examining the 1650.96nm absorption line of methane (CH4) with comparisons to theory.",
keywords = "tuneable diode laser spectroscopy , TDLS, wavelength modulation spectroscopy , WMS, residual amplitude modulation, RAM",
author = "K.C. Ruxton and A. Chakraborty and A.J. McGettrick and K. Duffin and G. Stewart",
year = "2009",
month = "10",
day = "5",
doi = "10.1117/12.833000",
language = "English",
note = "20th International Conference on Optical Fibre Sensors ; Conference date: 05-10-2009",

}

Ruxton, KC, Chakraborty, A, McGettrick, AJ, Duffin, K & Stewart, G 2009, 'Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications' Paper presented at 20th International Conference on Optical Fibre Sensors , Edinburgh, United Kingdom, 5/10/09, . https://doi.org/10.1117/12.833000

Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications. / Ruxton, K.C.; Chakraborty, A.; McGettrick, A.J.; Duffin, K.; Stewart, G.

2009. Paper presented at 20th International Conference on Optical Fibre Sensors , Edinburgh, United Kingdom.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications

AU - Ruxton, K.C.

AU - Chakraborty, A.

AU - McGettrick, A.J.

AU - Duffin, K.

AU - Stewart, G.

PY - 2009/10/5

Y1 - 2009/10/5

N2 - A limiting factor of tuneable diode laser spectroscopy (TDLS) with wavelength modulation spectroscopy (WMS) is the presence of background residual amplitude modulation (RAM) on the recovered 1st harmonic signal. The presence of this background term is due to direct modulation of the source laser power. This work presents a novel method to optically remove the unwanted background, with the major benefit being that measurement sensitivity can be increased. The recently developed phasor decomposition method1 (PDM), is a near IR (NIR) TDLS analysis technique that is used with the addition of the new RAM nulling method to recover gas absorption line-shapes. The PDM is a calibration free approach, which recovers the gas absorption line-shape and the isolated 1st derivative of the line-shape from the 1st harmonic signal. The work presented illustrates and validates the new RAM nulling procedure with measurements examining the 1650.96nm absorption line of methane (CH4) with comparisons to theory.

AB - A limiting factor of tuneable diode laser spectroscopy (TDLS) with wavelength modulation spectroscopy (WMS) is the presence of background residual amplitude modulation (RAM) on the recovered 1st harmonic signal. The presence of this background term is due to direct modulation of the source laser power. This work presents a novel method to optically remove the unwanted background, with the major benefit being that measurement sensitivity can be increased. The recently developed phasor decomposition method1 (PDM), is a near IR (NIR) TDLS analysis technique that is used with the addition of the new RAM nulling method to recover gas absorption line-shapes. The PDM is a calibration free approach, which recovers the gas absorption line-shape and the isolated 1st derivative of the line-shape from the 1st harmonic signal. The work presented illustrates and validates the new RAM nulling procedure with measurements examining the 1650.96nm absorption line of methane (CH4) with comparisons to theory.

KW - tuneable diode laser spectroscopy

KW - TDLS

KW - wavelength modulation spectroscopy

KW - WMS

KW - residual amplitude modulation

KW - RAM

UR - http://ofs20.iop.org/

U2 - 10.1117/12.833000

DO - 10.1117/12.833000

M3 - Paper

ER -

Ruxton KC, Chakraborty A, McGettrick AJ, Duffin K, Stewart G. Recent advance in tunable diode laser spectroscopy with background RAM nulling for industrial applications. 2009. Paper presented at 20th International Conference on Optical Fibre Sensors , Edinburgh, United Kingdom. https://doi.org/10.1117/12.833000