Abstract
Chalcopyrite solar cells are reported to have a high tolerance to irradiation by high energy electrons or ions, but the origin of this is not well understood. This work studies the evolution of damage in Ar + -bombarded CuInSe 2 single crystal using Rutherford backscattering/channeling analysis. Ar + ions of 30 keV were implanted with doses in the range from 10 12 to 3 × 10 16 cm -2 at room temperature. Implantation was found to create two layers of damage: (1) on the surface, caused by preferential sputtering of Se and Cu atoms; (2) at the layer of implanted Ar, possibly consisting of stacking faults and dislocation loops. The damage in the second layer was estimated to be less than 2% of the theoretical prediction suggesting efficient healing of primary implantation defects.
Original language | English |
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Article number | 051203 |
Number of pages | 6 |
Journal | Journal of Vacuum Science and Technology A |
Volume | 34 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Sept 2016 |
Keywords
- radiation damage
- CuInSe2
- solar cells
- Rutherford backscattering
- RBS
- Chalcopyrite