Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope

Naresh Gunasekar, Benjamin Hourahine, Paul Edwards, A.P. Day, Aimo Winkelmann, A.J. Wilkinson, P.J. Parbrook, G. England, Carol Trager-Cowan

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

We describe the use of electron channeling contrast imaging in the scanning electron microscope to rapidly and reliably image and identify threading dislocations (TDs) in materials with the wurtzite crystal structure. In electron channeling contrast imaging, vertical TDs are revealed as spots with black-white contrast. We have developed a simple geometric procedure which exploits the differences observed in the direction of this black-white contrast for screw, edge, and mixed dislocations for two electron channeling contrast images acquired from two symmetrically equivalent crystal planes whose g vectors are at 120° to each other. Our approach allows unambiguous identification of all TDs without the need to compare results with dynamical simulations of channeling contrast.
Original languageEnglish
Article number135503
Number of pages5
JournalPhysical Review Letters
Volume108
Issue number13
DOIs
Publication statusPublished - 30 Mar 2012

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wurtzite
electron microscopes
scanning
electrons
screw dislocations
edge dislocations
image contrast
crystal structure
crystals
simulation

Keywords

  • wurtzite
  • nondestructive analysis
  • scanning electron microscope

Cite this

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abstract = "We describe the use of electron channeling contrast imaging in the scanning electron microscope to rapidly and reliably image and identify threading dislocations (TDs) in materials with the wurtzite crystal structure. In electron channeling contrast imaging, vertical TDs are revealed as spots with black-white contrast. We have developed a simple geometric procedure which exploits the differences observed in the direction of this black-white contrast for screw, edge, and mixed dislocations for two electron channeling contrast images acquired from two symmetrically equivalent crystal planes whose g vectors are at 120° to each other. Our approach allows unambiguous identification of all TDs without the need to compare results with dynamical simulations of channeling contrast.",
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Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. / Gunasekar, Naresh; Hourahine, Benjamin; Edwards, Paul; Day, A.P.; Winkelmann, Aimo; Wilkinson, A.J.; Parbrook, P.J.; England, G.; Trager-Cowan, Carol.

In: Physical Review Letters, Vol. 108, No. 13, 135503, 30.03.2012.

Research output: Contribution to journalArticle

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T1 - Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope

AU - Gunasekar, Naresh

AU - Hourahine, Benjamin

AU - Edwards, Paul

AU - Day, A.P.

AU - Winkelmann, Aimo

AU - Wilkinson, A.J.

AU - Parbrook, P.J.

AU - England, G.

AU - Trager-Cowan, Carol

PY - 2012/3/30

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N2 - We describe the use of electron channeling contrast imaging in the scanning electron microscope to rapidly and reliably image and identify threading dislocations (TDs) in materials with the wurtzite crystal structure. In electron channeling contrast imaging, vertical TDs are revealed as spots with black-white contrast. We have developed a simple geometric procedure which exploits the differences observed in the direction of this black-white contrast for screw, edge, and mixed dislocations for two electron channeling contrast images acquired from two symmetrically equivalent crystal planes whose g vectors are at 120° to each other. Our approach allows unambiguous identification of all TDs without the need to compare results with dynamical simulations of channeling contrast.

AB - We describe the use of electron channeling contrast imaging in the scanning electron microscope to rapidly and reliably image and identify threading dislocations (TDs) in materials with the wurtzite crystal structure. In electron channeling contrast imaging, vertical TDs are revealed as spots with black-white contrast. We have developed a simple geometric procedure which exploits the differences observed in the direction of this black-white contrast for screw, edge, and mixed dislocations for two electron channeling contrast images acquired from two symmetrically equivalent crystal planes whose g vectors are at 120° to each other. Our approach allows unambiguous identification of all TDs without the need to compare results with dynamical simulations of channeling contrast.

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