Random field-union intersection tests for EEG/MEG imaging

F Carbonell, L Galan, P Valdes, K Worsley, R J Biscay, L Diaz-Comas, M A Bobes, M Parra

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

Electrophysiological (EEG/MEG) imaging challenges statistics by providing two views of the same spatiotemporal data: topographic and tomographic. Until now, statistical tests for these two situations have developed separately. This work introduces statistical tests for assessing simultaneously the significance of spatiotemporal event-related potential/event-related field (ERP/ERF) components and that of their sources. The test for detecting a component at a given time instant is provided by a Hotelling's T-2 statistic. This statistic is constructed in such a manner to be invariant to any choice of reference and is based upon a generalized version of the average reference transform of the data. As a consequence, the proposed test is a generalization of the well-known Global Field Power statistic. Consideration of tests at all time instants leads to a multiple comparison problem addressed by the use of Random Field Theory (RFT). The Union-Intersection (UI) principle is the basis for testing hypotheses about the topographic and tomographic distributions of such ERP/ERF components. The performance of the method is illustrated with actual EEG recordings obtained from a visual experiment of pattern reversal stimuli. (C) 2004 Elsevier Inc. All rights reserved.
LanguageEnglish
Pages268-276
Number of pages9
JournalNeuroImage
Volume22
Issue number1
DOIs
Publication statusPublished - May 2004

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Electroencephalography
Evoked Potentials

Keywords

  • event-related potentials
  • random fields
  • union Intersection test
  • Hotelling's T2
  • global field power
  • average reference
  • EEG/MEG source analysis

Cite this

Carbonell, F., Galan, L., Valdes, P., Worsley, K., Biscay, R. J., Diaz-Comas, L., ... Parra, M. (2004). Random field-union intersection tests for EEG/MEG imaging. NeuroImage, 22(1), 268-276. https://doi.org/10.1016/j.neuroimage.2004.01.020
Carbonell, F ; Galan, L ; Valdes, P ; Worsley, K ; Biscay, R J ; Diaz-Comas, L ; Bobes, M A ; Parra, M. / Random field-union intersection tests for EEG/MEG imaging. In: NeuroImage. 2004 ; Vol. 22, No. 1. pp. 268-276.
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Carbonell, F, Galan, L, Valdes, P, Worsley, K, Biscay, RJ, Diaz-Comas, L, Bobes, MA & Parra, M 2004, 'Random field-union intersection tests for EEG/MEG imaging' NeuroImage, vol. 22, no. 1, pp. 268-276. https://doi.org/10.1016/j.neuroimage.2004.01.020

Random field-union intersection tests for EEG/MEG imaging. / Carbonell, F; Galan, L; Valdes, P; Worsley, K; Biscay, R J; Diaz-Comas, L; Bobes, M A; Parra, M.

In: NeuroImage, Vol. 22, No. 1, 05.2004, p. 268-276.

Research output: Contribution to journalArticle

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Carbonell F, Galan L, Valdes P, Worsley K, Biscay RJ, Diaz-Comas L et al. Random field-union intersection tests for EEG/MEG imaging. NeuroImage. 2004 May;22(1):268-276. https://doi.org/10.1016/j.neuroimage.2004.01.020