Abstract
We present Raman-scattering measurements on InxGa1−xN over the entire composition range of the alloy. The frequencies of the A1(LO) and E2 modes are reported and show a good agreement with the one-mode behavior dispersion predicted by the modified random-element isodisplacement model. The A1(LO) mode displays a high intensity relative to the E2 mode due to resonant enhancement. For above band-gap excitation, the A1(LO) peak displays frequency shifts as a function of the excitation energy due to selective excitation of regions with different In contents, and strong multiphonon scattering up to 3LO is observed in outgoing resonance conditions.
Original language | English |
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Pages (from-to) | 013511-03515 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 98 |
DOIs | |
Publication status | Published - 2005 |
Keywords
- indium compounds
- phonon dispersion relations
- phonon-phonon interactions,
- spectral line shift
- energy gap
- Raman spectra
- semiconductor epitaxial layers
- gallium compounds, III-V semiconductors, wide band gap semiconductors