Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

H.C. Overweg; A.M.J. den Haan; H.J. Eerkens; P.F.A. Alkemade; A.L. La Rooij; R. J.C. Spreeuw; L. Bossoni; T.H. Oosterkamp

doi:10.1063/1.4928929

Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

H.C. Overweg, A.M.J. den Haan, H.J. Eerkens, P.F.A. Alkemade, A.L. La Rooij, R. J.C. Spreeuw, L. Bossoni, T.H. Oosterkamp

Physics

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

5 Downloads (Pure)

Abstract

We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10^-12 Am², which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

Original language	English
Article number	072402
Number of pages	4
Journal	Applied Physics Letters
Volume	107
Issue number	7
DOIs	https://doi.org/10.1063/1.4928929
Publication status	Published - 19 Aug 2015

Keywords

superconducting quantum interference device
electrical properties and parameters
electromagnetism
plasma processing
focused ion beam
electron beam-induced deposition
magnetic materials
photolithography
magnetic resonance force microscopy
magneto-optical trap

Access to Document

10.1063/1.4928929Licence: CC BY 3.0

Overweg-etal-APL-2015-Probing-the-magnetic-moment-of-FePt-micromagnetsFinal published version, 0.98 MBLicence: CC BY 3.0

Cite this

@article{ba1f9346d2c242369bf22e26feba71f3,

title = "Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling",

abstract = "We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10-12 Am2, which implies that 70\% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.",

keywords = "superconducting quantum interference device, electrical properties and parameters, electromagnetism, plasma processing, focused ion beam, electron beam-induced deposition, magnetic materials, photolithography, magnetic resonance force microscopy, magneto-optical trap",

author = "H.C. Overweg and \{den Haan\}, A.M.J. and H.J. Eerkens and P.F.A. Alkemade and \{La Rooij\}, A.L. and Spreeuw, \{R. J.C.\} and L. Bossoni and T.H. Oosterkamp",

year = "2015",

month = aug,

day = "19",

doi = "10.1063/1.4928929",

language = "English",

volume = "107",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}

TY - JOUR

T1 - Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

AU - Overweg, H.C.

AU - den Haan, A.M.J.

AU - Eerkens, H.J.

AU - Alkemade, P.F.A.

AU - La Rooij, A.L.

AU - Spreeuw, R. J.C.

AU - Bossoni, L.

AU - Oosterkamp, T.H.

PY - 2015/8/19

Y1 - 2015/8/19

N2 - We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10-12 Am2, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

AB - We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10-12 Am2, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

KW - superconducting quantum interference device

KW - electrical properties and parameters

KW - electromagnetism

KW - plasma processing

KW - focused ion beam

KW - electron beam-induced deposition

KW - magnetic materials

KW - photolithography

KW - magnetic resonance force microscopy

KW - magneto-optical trap

U2 - 10.1063/1.4928929

DO - 10.1063/1.4928929

M3 - Article

AN - SCOPUS:84939832188

SN - 0003-6951

VL - 107

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 7

M1 - 072402

ER -

Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

Abstract

Keywords

Access to Document

Fingerprint

Cite this