Preface for the special issue on Microscopy of Semiconducting Materials 2019

Thomas Walther, Yonatan Calahorra, Fabien Massabuau

Research output: Contribution to journalSpecial issuepeer-review

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Abstract

This issue contains selected invited and contributed presentations from the 21st international conference on 'Microscopy of Semiconducting Materials' held at Fitzwilliam College, University of Cambridge, on 9–12 April 2019. The meeting was organised by the Institute of Physics, supported by the Royal Microscopical Society, the European Microscopy Society, attolight (Platinum sponsor), JEOL (Gold sponsor) and ThermoFisher Scientific (Silver sponsor).
Original languageEnglish
Article number120201
Number of pages4
JournalSemiconductor Science and Technology
Volume35
Issue number12
DOIs
Publication statusPublished - 13 Oct 2020
Event21st International Conference on Microscopy of Semiconducting Materials - University of Cambridge, Cambridge, United Kingdom
Duration: 9 Apr 201912 Apr 2019
http://msmxxi.iopconfs.org/home

Keywords

  • preface
  • special issue
  • microscopy
  • semiconducting materials

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