Abstract
This issue contains selected invited and contributed presentations from the 21st international conference on 'Microscopy of Semiconducting Materials' held at Fitzwilliam College, University of Cambridge, on 9–12 April 2019. The meeting was organised by the Institute of Physics, supported by the Royal Microscopical Society, the European Microscopy Society, attolight (Platinum sponsor), JEOL (Gold sponsor) and ThermoFisher Scientific (Silver sponsor).
Original language | English |
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Article number | 120201 |
Number of pages | 4 |
Journal | Semiconductor Science and Technology |
Volume | 35 |
Issue number | 12 |
DOIs | |
Publication status | Published - 13 Oct 2020 |
Event | 21st International Conference on Microscopy of Semiconducting Materials - University of Cambridge, Cambridge, United Kingdom Duration: 9 Apr 2019 → 12 Apr 2019 http://msmxxi.iopconfs.org/home |
Keywords
- preface
- special issue
- microscopy
- semiconducting materials