Potential roughness near lithographically fabricated atom chips

P. Krüger, L. Andersson, S. Wildermuth, S. Hofferberth, E. Haller, S. Aigner, S. Groth, I. Bar-Joseph, J. Schmiedmayer

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Potential roughness near lithographically fabricated atom chips'. Together they form a unique fingerprint.