Abstract
Photostimulated emission (PSE) of epitaxial GaN layers is readily obtained at photoexcitation densities of order MW cm-2 at temperatures up to room temperature. We report surprising spectral differences between PSE obtained using surface and edge emission geometries for a particular sample. While the peak energy of PSE from the surface of this sample is downshifted from the GaN band edge by only a small amount, the photon energy of the edge-emitted light is reduced by ∼ 100 meV. Exactly the same downshift is observed in the edge emission spectrum of a commercial Nichia light emitting diode. The origin of the anomalous PSE peaks revealed in these measurements is discussed with reference to recent literature.
| Original language | English |
|---|---|
| Pages (from-to) | 264-267 |
| Number of pages | 4 |
| Journal | Materials Science and Engineering B |
| Volume | 50 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 18 Dec 1997 |
Funding
This work was partially funded by the Deutsches Forschungemeinschaft who supported a sabbatical visit by KPOD to the University of Karlsruhe in the summer of 1996.
Keywords
- edge-emitted light
- photoexcitation densities
- photostimulated emission
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