Peridynamic simulations of nanoindentation tests to determine elastic modulus of polymer thin films

Emrah Celik, Erkan Oterkus, Ibrahim Guven

Research output: Contribution to journalArticle

Abstract

This study combines atomic force microscope (AFM) nanoindentation tests and peridynamic (PD) simulations to extract the elastic moduli of polystyrene (PS) films with varying thicknesses. AFM nanoindentation tests are applied to relatively hard PS thin films deposited on soft polymer (polydimethylsiloxane (PDMS)) substrates. Linear force versus deformation response was observed in nanoindentation experiments and numerical simulations since the soft PDMS substrate under the stiff PS films allowed bending of thin PS films instead of penetration of AFM tip towards the PS films. The elastic moduli of PS thin films are found to be increasing with increasing film thickness. The validity of both the simulation and experimental results is established by comparison against those previously published in the literature.
LanguageEnglish
Pages1-27
Number of pages27
JournalJournal of Peridynamics and Nonlocal Modeling
Early online date12 Mar 2019
DOIs
Publication statusE-pub ahead of print - 12 Mar 2019

Fingerprint

Nanoindentation
Polymer films
Polystyrenes
Elastic moduli
Thin films
Microscopes
Polydimethylsiloxane
Substrates
Film thickness
Computer simulation
Polymers
Experiments

Keywords

  • atomic force microscope
  • peridyamic simulations
  • polystyrene films

Cite this

@article{6ff106d96a454aa4a0d0d9f3612a9c2a,
title = "Peridynamic simulations of nanoindentation tests to determine elastic modulus of polymer thin films",
abstract = "This study combines atomic force microscope (AFM) nanoindentation tests and peridynamic (PD) simulations to extract the elastic moduli of polystyrene (PS) films with varying thicknesses. AFM nanoindentation tests are applied to relatively hard PS thin films deposited on soft polymer (polydimethylsiloxane (PDMS)) substrates. Linear force versus deformation response was observed in nanoindentation experiments and numerical simulations since the soft PDMS substrate under the stiff PS films allowed bending of thin PS films instead of penetration of AFM tip towards the PS films. The elastic moduli of PS thin films are found to be increasing with increasing film thickness. The validity of both the simulation and experimental results is established by comparison against those previously published in the literature.",
keywords = "atomic force microscope, peridyamic simulations, polystyrene films",
author = "Emrah Celik and Erkan Oterkus and Ibrahim Guven",
year = "2019",
month = "3",
day = "12",
doi = "10.1007/s42102-019-0005-4",
language = "English",
pages = "1--27",
journal = "Journal of Peridynamics and Nonlocal Modeling",
issn = "2522-896X",

}

Peridynamic simulations of nanoindentation tests to determine elastic modulus of polymer thin films. / Celik, Emrah; Oterkus, Erkan; Guven, Ibrahim.

In: Journal of Peridynamics and Nonlocal Modeling, 12.03.2019, p. 1-27.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Peridynamic simulations of nanoindentation tests to determine elastic modulus of polymer thin films

AU - Celik, Emrah

AU - Oterkus, Erkan

AU - Guven, Ibrahim

PY - 2019/3/12

Y1 - 2019/3/12

N2 - This study combines atomic force microscope (AFM) nanoindentation tests and peridynamic (PD) simulations to extract the elastic moduli of polystyrene (PS) films with varying thicknesses. AFM nanoindentation tests are applied to relatively hard PS thin films deposited on soft polymer (polydimethylsiloxane (PDMS)) substrates. Linear force versus deformation response was observed in nanoindentation experiments and numerical simulations since the soft PDMS substrate under the stiff PS films allowed bending of thin PS films instead of penetration of AFM tip towards the PS films. The elastic moduli of PS thin films are found to be increasing with increasing film thickness. The validity of both the simulation and experimental results is established by comparison against those previously published in the literature.

AB - This study combines atomic force microscope (AFM) nanoindentation tests and peridynamic (PD) simulations to extract the elastic moduli of polystyrene (PS) films with varying thicknesses. AFM nanoindentation tests are applied to relatively hard PS thin films deposited on soft polymer (polydimethylsiloxane (PDMS)) substrates. Linear force versus deformation response was observed in nanoindentation experiments and numerical simulations since the soft PDMS substrate under the stiff PS films allowed bending of thin PS films instead of penetration of AFM tip towards the PS films. The elastic moduli of PS thin films are found to be increasing with increasing film thickness. The validity of both the simulation and experimental results is established by comparison against those previously published in the literature.

KW - atomic force microscope

KW - peridyamic simulations

KW - polystyrene films

UR - https://link.springer.com/journal/42102

U2 - 10.1007/s42102-019-0005-4

DO - 10.1007/s42102-019-0005-4

M3 - Article

SP - 1

EP - 27

JO - Journal of Peridynamics and Nonlocal Modeling

T2 - Journal of Peridynamics and Nonlocal Modeling

JF - Journal of Peridynamics and Nonlocal Modeling

SN - 2522-896X

ER -