Peridynamic simulations of nanoindentation tests to determine elastic modulus of polymer thin films

Emrah Celik, Erkan Oterkus, Ibrahim Guven

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Abstract

This study combines atomic force microscope (AFM) nanoindentation tests and peridynamic (PD) simulations to extract the elastic moduli of polystyrene (PS) films with varying thicknesses. AFM nanoindentation tests are applied to relatively hard PS thin films deposited on soft polymer (polydimethylsiloxane (PDMS)) substrates. Linear force versus deformation response was observed in nanoindentation experiments and numerical simulations since the soft PDMS substrate under the stiff PS films allowed bending of thin PS films instead of penetration of AFM tip towards the PS films. The elastic moduli of PS thin films are found to be increasing with increasing film thickness. The validity of both the simulation and experimental results is established by comparison against those previously published in the literature.
Original languageEnglish
Pages (from-to)1-27
Number of pages27
JournalJournal of Peridynamics and Nonlocal Modeling
Early online date12 Mar 2019
DOIs
Publication statusE-pub ahead of print - 12 Mar 2019

Keywords

  • atomic force microscope
  • peridyamic simulations
  • polystyrene films

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