PD activity in void type dielectric samples for varied DC polarity

Edward Corr, W. H. Siew, Weijia Zhao

Research output: Contribution to conferencePaper

3 Citations (Scopus)
40 Downloads (Pure)

Abstract

This paper discusses the DC testing of a dielectric sample (with voids) under DC conditions. The ramp test method was employed to assess whether the tests were repeatable. Three DC ramp tests were performed in quick succession. The polarity of the first/third tests was positive and the polarity of the second test was negative. The resultant partial discharge activity was analyzed for each series of tests and compared for positive and negative conditions. The results show that the inclusion of a negative ramp between two positive ramps enabled similar PD activity to be recorded in the first and second positive ramp tests. The negative cycle was used to re-initialise the test sample and allows trapped charge to migrate enabling similar PD activity in the subsequent positive ramp test. Changes in PD behavior were observed in the distribution of PD data between the tests.
Original languageEnglish
Number of pages4
Publication statusPublished - 16 Oct 2016
EventConference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Eaton Chelsea, Toronto, Canada
Duration: 16 Oct 201619 Oct 2016
http://sites.ieee.org/ceidp/

Conference

ConferenceConference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Abbreviated titleCEIDP
CountryCanada
CityToronto
Period16/10/1619/10/16
Internet address

Keywords

  • cable insulation
  • condition monitoring
  • HVDC transmission
  • partial discharge
  • DC testing
  • varied DC polarity
  • ramp test method

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  • Cite this

    Corr, E., Siew, W. H., & Zhao, W. (2016). PD activity in void type dielectric samples for varied DC polarity. Paper presented at Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Toronto, Canada.