Parametric data analysis of bistable stochastic systems

T Frank, M. Sondermann, Thorsten Ackemann, R Friedrich

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A data analysis method is proposed to derive drift and diffusion functions of Markov diffusion processes in terms of function series and expansion coefficients. The data analysis method is exemplified for a generic bistable stochastic systems involving a double-well potential and for a vertical-cavity surface-emitting laser system exhibiting an optical bistability.
Original languageEnglish
Pages (from-to)193-199
Number of pages7
JournalNonlinear Phenomena In Complex Systems
Volume8
Issue number2
Publication statusPublished - 2005

Keywords

  • parametric data
  • data analysis
  • bistable stochastic systems
  • vertical-cavity surface-emitting laser

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