Parametric data analysis of bistable stochastic systems

T Frank, M. Sondermann, Thorsten Ackemann, R Friedrich

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A data analysis method is proposed to derive drift and diffusion functions of Markov diffusion processes in terms of function series and expansion coefficients. The data analysis method is exemplified for a generic bistable stochastic systems involving a double-well potential and for a vertical-cavity surface-emitting laser system exhibiting an optical bistability.
LanguageEnglish
Pages193-199
Number of pages7
JournalNonlinear Phenomena In Complex Systems
Volume8
Issue number2
Publication statusPublished - 2005

Fingerprint

Bistable System
Stochastic Systems
Data analysis
Optical Bistability
Double-well Potential
Vertical-cavity Surface-emitting Laser (VCSEL)
optical bistability
surface emitting lasers
Markov Process
Diffusion Process
cavities
expansion
Series
Coefficient
coefficients

Keywords

  • parametric data
  • data analysis
  • bistable stochastic systems
  • vertical-cavity surface-emitting laser

Cite this

Frank, T ; Sondermann, M. ; Ackemann, Thorsten ; Friedrich, R. / Parametric data analysis of bistable stochastic systems. In: Nonlinear Phenomena In Complex Systems. 2005 ; Vol. 8, No. 2. pp. 193-199.
@article{b866707aec13463c8722f9c81623b07e,
title = "Parametric data analysis of bistable stochastic systems",
abstract = "A data analysis method is proposed to derive drift and diffusion functions of Markov diffusion processes in terms of function series and expansion coefficients. The data analysis method is exemplified for a generic bistable stochastic systems involving a double-well potential and for a vertical-cavity surface-emitting laser system exhibiting an optical bistability.",
keywords = "parametric data, data analysis, bistable stochastic systems , vertical-cavity surface-emitting laser",
author = "T Frank and M. Sondermann and Thorsten Ackemann and R Friedrich",
year = "2005",
language = "English",
volume = "8",
pages = "193--199",
journal = "Nonlinear Phenomena In Complex Systems",
issn = "1561-4085",
number = "2",

}

Frank, T, Sondermann, M, Ackemann, T & Friedrich, R 2005, 'Parametric data analysis of bistable stochastic systems' Nonlinear Phenomena In Complex Systems, vol. 8, no. 2, pp. 193-199.

Parametric data analysis of bistable stochastic systems. / Frank, T; Sondermann, M.; Ackemann, Thorsten; Friedrich, R.

In: Nonlinear Phenomena In Complex Systems, Vol. 8, No. 2, 2005, p. 193-199.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Parametric data analysis of bistable stochastic systems

AU - Frank, T

AU - Sondermann, M.

AU - Ackemann, Thorsten

AU - Friedrich, R

PY - 2005

Y1 - 2005

N2 - A data analysis method is proposed to derive drift and diffusion functions of Markov diffusion processes in terms of function series and expansion coefficients. The data analysis method is exemplified for a generic bistable stochastic systems involving a double-well potential and for a vertical-cavity surface-emitting laser system exhibiting an optical bistability.

AB - A data analysis method is proposed to derive drift and diffusion functions of Markov diffusion processes in terms of function series and expansion coefficients. The data analysis method is exemplified for a generic bistable stochastic systems involving a double-well potential and for a vertical-cavity surface-emitting laser system exhibiting an optical bistability.

KW - parametric data

KW - data analysis

KW - bistable stochastic systems

KW - vertical-cavity surface-emitting laser

UR - http://www.j-npcs.org/abstracts/vol2005/v8no2/v8no2p193.html

M3 - Article

VL - 8

SP - 193

EP - 199

JO - Nonlinear Phenomena In Complex Systems

T2 - Nonlinear Phenomena In Complex Systems

JF - Nonlinear Phenomena In Complex Systems

SN - 1561-4085

IS - 2

ER -