Optical linewidths of InGaN light emitting diodes and epilayers

K. P. O'Donnell; T. Breitkopf; H. Kalt; W. Van Der Stricht; I. Moerman; P. Demeester; P. G. Middleton

doi:10.1063/1.118728

Optical linewidths of InGaN light emitting diodes and epilayers

K. P. O'Donnell, T. Breitkopf, H. Kalt, W. Van Der Stricht, I. Moerman, P. Demeester, P. G. Middleton

Physics

Research output: Contribution to journal › Article

72 Citations (Scopus)

Abstract

A comparative study of the optical linewidths of photo- and electroluminescence from high-quality InGaN epilayers and commercial single quantum well light emitting diode structures was undertaken. Optical linewidths in both cases are temperature insensitive and increase systematically with increasing indium concentration. We assess the contribution of three mechanisms to the luminescence linewidth: alloy fluctuations, well width fluctuations, and strain effects. It is found that the broadening of the emission line is an intrinsic property of InGaN alloys. The piezoelectric effect in wurtzite semiconductor is proposed as a novel line-broadening mechanism.

Original language	English
Pages (from-to)	1843-1845
Number of pages	3
Journal	Applied Physics Letters
Volume	70
Issue number	14
DOIs	https://doi.org/10.1063/1.118728
Publication status	Published - 7 Apr 1997

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Keywords

optical linewidth
electroluminescence
InGaN
lght emitting diode

Cite this

O'Donnell, K. P., Breitkopf, T., Kalt, H., Van Der Stricht, W., Moerman, I., Demeester, P., & Middleton, P. G. (1997). Optical linewidths of InGaN light emitting diodes and epilayers. Applied Physics Letters, 70(14), 1843-1845. https://doi.org/10.1063/1.118728

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AU - O'Donnell, K. P.

AU - Breitkopf, T.

AU - Kalt, H.

AU - Van Der Stricht, W.

AU - Moerman, I.

AU - Demeester, P.

AU - Middleton, P. G.

PY - 1997/4/7

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N2 - A comparative study of the optical linewidths of photo- and electroluminescence from high-quality InGaN epilayers and commercial single quantum well light emitting diode structures was undertaken. Optical linewidths in both cases are temperature insensitive and increase systematically with increasing indium concentration. We assess the contribution of three mechanisms to the luminescence linewidth: alloy fluctuations, well width fluctuations, and strain effects. It is found that the broadening of the emission line is an intrinsic property of InGaN alloys. The piezoelectric effect in wurtzite semiconductor is proposed as a novel line-broadening mechanism.

AB - A comparative study of the optical linewidths of photo- and electroluminescence from high-quality InGaN epilayers and commercial single quantum well light emitting diode structures was undertaken. Optical linewidths in both cases are temperature insensitive and increase systematically with increasing indium concentration. We assess the contribution of three mechanisms to the luminescence linewidth: alloy fluctuations, well width fluctuations, and strain effects. It is found that the broadening of the emission line is an intrinsic property of InGaN alloys. The piezoelectric effect in wurtzite semiconductor is proposed as a novel line-broadening mechanism.

KW - optical linewidth

KW - electroluminescence

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KW - lght emitting diode

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10.1063/1.118728

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