On the accuracy of total-IBA

C. Jeynes, V.V. Palitsin, M. Kokkoris, A. Hamilton, G.W. Grime

Research output: Contribution to journalArticle

Abstract

"Total-IBA" implies the synergistic use of multiple IBA techniques. It has been claimed that Total–IBA inherits the accuracy of the most accurate IBA technique used. A specific example is now given of this where (in vacuo) EBS/PIXE of a glass sample uniform in depth is validated against absolutely calibrated EPMA of the same sample. The EPMA results had a mass closure gap of 2.0 ± 0.6 wt%; the full PIXE analysis determined the composition of this missing 2 wt%. The PIXE calibration was against a single certified glass sample, with uncertainties per line ~10%. Benchmarking also demonstrates ~10% underestimation of the Si scattering cross-section at proton energies ~3 MeV. But the Total-IBA determination of the silica content had a low standard uncertainty of about 2%. This is due to the strong constraints of both the chemical prior and also the mass closure properties of the EBS. Irradiation-induced sodium migration in this soda-lime glass is explored.
Original languageEnglish
Pages (from-to)85-100
Number of pages16
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume465
Early online date21 Jan 2020
DOIs
Publication statusPublished - 15 Feb 2020

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Keywords

  • ion beam analysis
  • particle-induced x-ray emission
  • elastic backscattering
  • Na migration
  • Rosslyn Chapel

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