On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis

Day-Uei Li, Eleanor Bonnist, David Renshaw, Robert Henderson

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.
LanguageEnglish
Pages1190-1198
Number of pages9
JournalJournal of the Optical Society of America A
Volume25
Issue number5
DOIs
Publication statusPublished - 31 May 2008

Fingerprint

error analysis
Error analysis
Fluorescence
chips
life (durability)
fluorescence
Maximum likelihood estimation
Microscopic examination
Statistics
Imaging techniques
Timing jitter
statistics
microscopy
Computer hardware
least squares method
Signal to noise ratio
Photons
converters
hardware
counters

Keywords

  • fluorescence-lifetime-imaging microscopy
  • on-chip lifetime extractions
  • signal-to-noise-ratio
  • Monte Carlo simulations
  • maximum-likelihood-estimation

Cite this

Li, Day-Uei ; Bonnist, Eleanor ; Renshaw, David ; Henderson, Robert. / On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis. In: Journal of the Optical Society of America A. 2008 ; Vol. 25, No. 5. pp. 1190-1198.
@article{4ef26397806b4ab29f317834fb0e83dc,
title = "On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis",
abstract = "A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.",
keywords = "fluorescence-lifetime-imaging microscopy , on-chip lifetime extractions, signal-to-noise-ratio, Monte Carlo simulations, maximum-likelihood-estimation",
author = "Day-Uei Li and Eleanor Bonnist and David Renshaw and Robert Henderson",
year = "2008",
month = "5",
day = "31",
doi = "10.1364/JOSAA.25.001190",
language = "English",
volume = "25",
pages = "1190--1198",
journal = "Journal of the Optical Society of America A",
issn = "1084-7529",
publisher = "Optical Society of America",
number = "5",

}

On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis. / Li, Day-Uei; Bonnist, Eleanor; Renshaw, David; Henderson, Robert.

In: Journal of the Optical Society of America A, Vol. 25, No. 5, 31.05.2008, p. 1190-1198.

Research output: Contribution to journalArticle

TY - JOUR

T1 - On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis

AU - Li, Day-Uei

AU - Bonnist, Eleanor

AU - Renshaw, David

AU - Henderson, Robert

PY - 2008/5/31

Y1 - 2008/5/31

N2 - A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.

AB - A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.

KW - fluorescence-lifetime-imaging microscopy

KW - on-chip lifetime extractions

KW - signal-to-noise-ratio

KW - Monte Carlo simulations

KW - maximum-likelihood-estimation

U2 - 10.1364/JOSAA.25.001190

DO - 10.1364/JOSAA.25.001190

M3 - Article

VL - 25

SP - 1190

EP - 1198

JO - Journal of the Optical Society of America A

T2 - Journal of the Optical Society of America A

JF - Journal of the Optical Society of America A

SN - 1084-7529

IS - 5

ER -