Abstract
| Language | English |
|---|---|
| Pages | 1190-1198 |
| Number of pages | 9 |
| Journal | Journal of the Optical Society of America A |
| Volume | 25 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 31 May 2008 |
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Keywords
- fluorescence-lifetime-imaging microscopy
- on-chip lifetime extractions
- signal-to-noise-ratio
- Monte Carlo simulations
- maximum-likelihood-estimation
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On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis. / Li, Day-Uei; Bonnist, Eleanor; Renshaw, David; Henderson, Robert.
In: Journal of the Optical Society of America A, Vol. 25, No. 5, 31.05.2008, p. 1190-1198.Research output: Contribution to journal › Article
TY - JOUR
T1 - On-chip time-correlated fluorescence lifetime extraction algorithms and error analysis
AU - Li, Day-Uei
AU - Bonnist, Eleanor
AU - Renshaw, David
AU - Henderson, Robert
PY - 2008/5/31
Y1 - 2008/5/31
N2 - A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.
AB - A new, simple, and hardware-only fluorescence-lifetime-imaging microscopy (FLIM) is proposed to implement on-chip lifetime extractions, and their signal-to-noise-ratio based on statistics theory is also deduced. The results are compared with Monte Carlo simulations, giving good agreement. Compared with the commonly used iterative least-squares method or the maximum-likelihood-estimation- (MLE-) based, general purpose FLIM analysis software, our algorithm offers direct calculation of fluorescence lifetime based on the collected photon counts stored in on-chip counters and therefore delivers faster analysis for real-time applications, such as clinical diagnosis. Error analysis considering timing jitter based on statistics theory is carried out for the proposed algorithms and is also compared with MLE to obtain optimized channel width or measurement window and bit resolution of the time-to-digital converters for a given accuracy. A multi-exponential, pipelined fluorescence lifetime method based on the proposed algorithms is also introduced. The performance of the proposed methods has been tested on mono-exponential and four-exponential decay experimental data.
KW - fluorescence-lifetime-imaging microscopy
KW - on-chip lifetime extractions
KW - signal-to-noise-ratio
KW - Monte Carlo simulations
KW - maximum-likelihood-estimation
U2 - 10.1364/JOSAA.25.001190
DO - 10.1364/JOSAA.25.001190
M3 - Article
VL - 25
SP - 1190
EP - 1198
JO - Journal of the Optical Society of America A
T2 - Journal of the Optical Society of America A
JF - Journal of the Optical Society of America A
SN - 1084-7529
IS - 5
ER -