Abstract
Non-invasive monitoring of silicon microring resonators is demonstrated through a novel contactless integrated photonic probe, which enables multi-point light observation on chip and proves its utility for the tuning and control of photonic integrated devices.
| Original language | English |
|---|---|
| Title of host publication | 2014 IEEE Proceedings of the Optical Interconnects Conference, OI 2014 |
| Publisher | IEEE |
| Pages | 9-10 |
| Number of pages | 2 |
| ISBN (Print) | 9781479924684 |
| DOIs | |
| Publication status | Published - May 2014 |
| Event | 2014 25th IEEE Optical Interconnects Conference, OI 2014 - San Diego, CA, United Kingdom Duration: 4 May 2014 → 7 May 2014 |
Conference
| Conference | 2014 25th IEEE Optical Interconnects Conference, OI 2014 |
|---|---|
| Country/Territory | United Kingdom |
| City | San Diego, CA |
| Period | 4/05/14 → 7/05/14 |
Keywords
- optical control
- optical tuning
- noninvasive monitoring
- silicon microring resonators
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