Non-invasive monitoring of silicon microring resonators through contactless integrated photonics probes

F. Morichetti, S. Grillanda, M. Carminati, G. Ferrari, M. J. Strain, M. Sorel, M. Sampietro, A. Melloni

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

1 Citation (Scopus)

Abstract

Non-invasive monitoring of silicon microring resonators is demonstrated through a novel contactless integrated photonic probe, which enables multi-point light observation on chip and proves its utility for the tuning and control of photonic integrated devices.

Original languageEnglish
Title of host publication2014 IEEE Proceedings of the Optical Interconnects Conference, OI 2014
PublisherIEEE
Pages9-10
Number of pages2
ISBN (Print)9781479924684
DOIs
Publication statusPublished - May 2014
Event2014 25th IEEE Optical Interconnects Conference, OI 2014 - San Diego, CA, United Kingdom
Duration: 4 May 20147 May 2014

Conference

Conference2014 25th IEEE Optical Interconnects Conference, OI 2014
CountryUnited Kingdom
CitySan Diego, CA
Period4/05/147/05/14

Keywords

  • optical control
  • optical tuning
  • noninvasive monitoring
  • silicon microring resonators

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  • Cite this

    Morichetti, F., Grillanda, S., Carminati, M., Ferrari, G., Strain, M. J., Sorel, M., Sampietro, M., & Melloni, A. (2014). Non-invasive monitoring of silicon microring resonators through contactless integrated photonics probes. In 2014 IEEE Proceedings of the Optical Interconnects Conference, OI 2014 (pp. 9-10). IEEE. https://doi.org/10.1109/OIC.2014.6886053