Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography

Shuncong Zhong, Yao-Chun Shen, Louise Ho, Robert K. May, J. Axel Zeitler, Mike Evans, Philip F. Taday, Michael Pepper, Thomas Rades, Keith C. Gordon, Ronny Müller, Peter Kleinebudde

Research output: Contribution to journalArticle

83 Citations (Scopus)

Abstract

Optical coherence tomography (OCT) and terahertz pulsed imaging (TPI) are two powerful techniques allowing high quality cross-sectional images from within scattering media to be obtained non-destructively. In this paper, we report experimental results of using OCT and TPI for quantitatively characterizing pharmaceutical tablet coatings in the thickness range of 10–140 μm. We found that the spectral OCT system developed in-house has an axial resolution of 0.9 μm, and is capable of quantifying very thin coatings in the range of 10–60 μm. The upper limit of 60 μm within the tablet coating and core is owed to the strong scattering of OCT light, which has relatively short wavelengths in the range of 0.5–1.0 μm. On the other hand, TPI utilizes terahertz radiation that has substantially long wavelengths in the range of hundreds of microns, and thus is less prone to the scattering problem. Consequently TPI has been demonstrated to be able to quantify thicker coatings in the range of 40–140 μm and beyond. We concluded that OCT and TPI are two complementary analytical techniques for non-destructive and quantitative characterization of pharmaceutical tablet coatings.
LanguageEnglish
Pages361-365
Number of pages5
JournalOptics and Lasers in Engineering
Volume49
Issue number3
Early online date3 Dec 2010
DOIs
Publication statusPublished - Mar 2011

Fingerprint

tablets
Optical tomography
Drug products
Tablets
tomography
Imaging techniques
coatings
Coatings
Pharmaceutical Preparations
Scattering
scattering
Wavelength
wavelengths
Radiation
radiation

Keywords

  • non-destructive testing
  • optical coherence tomography
  • terahertz pulsed imaging
  • tablet coating thickness

Cite this

Zhong, Shuncong ; Shen, Yao-Chun ; Ho, Louise ; May, Robert K. ; Zeitler, J. Axel ; Evans, Mike ; Taday, Philip F. ; Pepper, Michael ; Rades, Thomas ; Gordon, Keith C. ; Müller, Ronny ; Kleinebudde, Peter . / Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography. In: Optics and Lasers in Engineering. 2011 ; Vol. 49, No. 3. pp. 361-365.
@article{33c78e365ff44ef697bcd11ba76868e7,
title = "Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography",
abstract = "Optical coherence tomography (OCT) and terahertz pulsed imaging (TPI) are two powerful techniques allowing high quality cross-sectional images from within scattering media to be obtained non-destructively. In this paper, we report experimental results of using OCT and TPI for quantitatively characterizing pharmaceutical tablet coatings in the thickness range of 10–140 μm. We found that the spectral OCT system developed in-house has an axial resolution of 0.9 μm, and is capable of quantifying very thin coatings in the range of 10–60 μm. The upper limit of 60 μm within the tablet coating and core is owed to the strong scattering of OCT light, which has relatively short wavelengths in the range of 0.5–1.0 μm. On the other hand, TPI utilizes terahertz radiation that has substantially long wavelengths in the range of hundreds of microns, and thus is less prone to the scattering problem. Consequently TPI has been demonstrated to be able to quantify thicker coatings in the range of 40–140 μm and beyond. We concluded that OCT and TPI are two complementary analytical techniques for non-destructive and quantitative characterization of pharmaceutical tablet coatings.",
keywords = "non-destructive testing, optical coherence tomography, terahertz pulsed imaging, tablet coating thickness",
author = "Shuncong Zhong and Yao-Chun Shen and Louise Ho and May, {Robert K.} and Zeitler, {J. Axel} and Mike Evans and Taday, {Philip F.} and Michael Pepper and Thomas Rades and Gordon, {Keith C.} and Ronny M{\"u}ller and Peter Kleinebudde",
year = "2011",
month = "3",
doi = "10.1016/j.optlaseng.2010.11.003",
language = "English",
volume = "49",
pages = "361--365",
journal = "Optics and Lasers in Engineering",
issn = "0143-8166",
number = "3",

}

Zhong, S, Shen, Y-C, Ho, L, May, RK, Zeitler, JA, Evans, M, Taday, PF, Pepper, M, Rades, T, Gordon, KC, Müller, R & Kleinebudde, P 2011, 'Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography' Optics and Lasers in Engineering, vol. 49, no. 3, pp. 361-365. https://doi.org/10.1016/j.optlaseng.2010.11.003

Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography. / Zhong, Shuncong; Shen, Yao-Chun; Ho, Louise; May, Robert K.; Zeitler, J. Axel ; Evans, Mike; Taday, Philip F.; Pepper, Michael; Rades, Thomas; Gordon, Keith C.; Müller, Ronny ; Kleinebudde, Peter .

In: Optics and Lasers in Engineering, Vol. 49, No. 3, 03.2011, p. 361-365.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Non-destructive quantification of pharmaceutical tablet coatings using terahertz pulsed imaging and optical coherence tomography

AU - Zhong, Shuncong

AU - Shen, Yao-Chun

AU - Ho, Louise

AU - May, Robert K.

AU - Zeitler, J. Axel

AU - Evans, Mike

AU - Taday, Philip F.

AU - Pepper, Michael

AU - Rades, Thomas

AU - Gordon, Keith C.

AU - Müller, Ronny

AU - Kleinebudde, Peter

PY - 2011/3

Y1 - 2011/3

N2 - Optical coherence tomography (OCT) and terahertz pulsed imaging (TPI) are two powerful techniques allowing high quality cross-sectional images from within scattering media to be obtained non-destructively. In this paper, we report experimental results of using OCT and TPI for quantitatively characterizing pharmaceutical tablet coatings in the thickness range of 10–140 μm. We found that the spectral OCT system developed in-house has an axial resolution of 0.9 μm, and is capable of quantifying very thin coatings in the range of 10–60 μm. The upper limit of 60 μm within the tablet coating and core is owed to the strong scattering of OCT light, which has relatively short wavelengths in the range of 0.5–1.0 μm. On the other hand, TPI utilizes terahertz radiation that has substantially long wavelengths in the range of hundreds of microns, and thus is less prone to the scattering problem. Consequently TPI has been demonstrated to be able to quantify thicker coatings in the range of 40–140 μm and beyond. We concluded that OCT and TPI are two complementary analytical techniques for non-destructive and quantitative characterization of pharmaceutical tablet coatings.

AB - Optical coherence tomography (OCT) and terahertz pulsed imaging (TPI) are two powerful techniques allowing high quality cross-sectional images from within scattering media to be obtained non-destructively. In this paper, we report experimental results of using OCT and TPI for quantitatively characterizing pharmaceutical tablet coatings in the thickness range of 10–140 μm. We found that the spectral OCT system developed in-house has an axial resolution of 0.9 μm, and is capable of quantifying very thin coatings in the range of 10–60 μm. The upper limit of 60 μm within the tablet coating and core is owed to the strong scattering of OCT light, which has relatively short wavelengths in the range of 0.5–1.0 μm. On the other hand, TPI utilizes terahertz radiation that has substantially long wavelengths in the range of hundreds of microns, and thus is less prone to the scattering problem. Consequently TPI has been demonstrated to be able to quantify thicker coatings in the range of 40–140 μm and beyond. We concluded that OCT and TPI are two complementary analytical techniques for non-destructive and quantitative characterization of pharmaceutical tablet coatings.

KW - non-destructive testing

KW - optical coherence tomography

KW - terahertz pulsed imaging

KW - tablet coating thickness

UR - http://www.sciencedirect.com/science/article/pii/S0143816610002472

U2 - 10.1016/j.optlaseng.2010.11.003

DO - 10.1016/j.optlaseng.2010.11.003

M3 - Article

VL - 49

SP - 361

EP - 365

JO - Optics and Lasers in Engineering

T2 - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

SN - 0143-8166

IS - 3

ER -